Accurate prediction of mega-electron-volt electron beam properties from UED using machine learning

Accurate prediction of mega-electron-volt electron beam properties from UED using machine learning

Abstract To harness the full potential of the ultrafast electron diffraction (UED) and microscopy (UEM), we must know accurately the electron beam properties, such as emittance, energy spread, spatial-pointing jitter, and shot-to-shot energy fluctuation. Owing to the inherent fluctuations in UED/UEM...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Zhe Zhang, Xi Yang, Xiaobiao Huang, Junjie Li, Timur Shaftan, Victor Smaluk, Minghao Song, Weishi Wan, Lijun Wu, Yimei Zhu
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
Materias:
Medicine
R
Science
Q
Acceso en línea:https://doaj.org/article/a8e49568fa624eb3aa76fcf10c35690d
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!

Ejemplares similares

Ejemplares similares