Accurate prediction of mega-electron-volt electron beam properties from UED using machine learning

Accurate prediction of mega-electron-volt electron beam properties from UED using machine learning

Abstract To harness the full potential of the ultrafast electron diffraction (UED) and microscopy (UEM), we must know accurately the electron beam properties, such as emittance, energy spread, spatial-pointing jitter, and shot-to-shot energy fluctuation. Owing to the inherent fluctuations in UED/UEM...

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Main Authors: Zhe Zhang, Xi Yang, Xiaobiao Huang, Junjie Li, Timur Shaftan, Victor Smaluk, Minghao Song, Weishi Wan, Lijun Wu, Yimei Zhu
Format: article
Language:EN
Published: Nature Portfolio 2021
Subjects:
Medicine
R
Science
Q
Online Access:https://doaj.org/article/a8e49568fa624eb3aa76fcf10c35690d
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