Single-defect spectroscopy in the shortwave infrared
Chemical defects endow materials with unique properties but their investigation is challenging due to their small footprint. Here the authors develop a high throughput shortwave infrared spectroscopy method enabling spectral identification and quantitative counting of fluorescent chemical defects at...
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| Autores principales: | , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2019
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/aac73f45920342b59723b2d72aa06e2e |
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| Sumario: | Chemical defects endow materials with unique properties but their investigation is challenging due to their small footprint. Here the authors develop a high throughput shortwave infrared spectroscopy method enabling spectral identification and quantitative counting of fluorescent chemical defects at the single defect level. |
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