Single-defect spectroscopy in the shortwave infrared

Chemical defects endow materials with unique properties but their investigation is challenging due to their small footprint. Here the authors develop a high throughput shortwave infrared spectroscopy method enabling spectral identification and quantitative counting of fluorescent chemical defects at...

Descripción completa

Guardado en:

Detalles Bibliográficos
Autores principales:	Xiaojian Wu, Mijin Kim, Haoran Qu, YuHuang Wang
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2019
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/aac73f45920342b59723b2d72aa06e2e
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

id	oai:doaj.org-article:aac73f45920342b59723b2d72aa06e2e
record_format	dspace
spelling	oai:doaj.org-article:aac73f45920342b59723b2d72aa06e2e2021-12-02T16:57:08ZSingle-defect spectroscopy in the shortwave infrared10.1038/s41467-019-10788-82041-1723https://doaj.org/article/aac73f45920342b59723b2d72aa06e2e2019-06-01T00:00:00Zhttps://doi.org/10.1038/s41467-019-10788-8https://doaj.org/toc/2041-1723Chemical defects endow materials with unique properties but their investigation is challenging due to their small footprint. Here the authors develop a high throughput shortwave infrared spectroscopy method enabling spectral identification and quantitative counting of fluorescent chemical defects at the single defect level.Xiaojian WuMijin KimHaoran QuYuHuang WangNature PortfolioarticleScienceQENNature Communications, Vol 10, Iss 1, Pp 1-7 (2019)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Xiaojian Wu Mijin Kim Haoran Qu YuHuang Wang Single-defect spectroscopy in the shortwave infrared
description	Chemical defects endow materials with unique properties but their investigation is challenging due to their small footprint. Here the authors develop a high throughput shortwave infrared spectroscopy method enabling spectral identification and quantitative counting of fluorescent chemical defects at the single defect level.
format	article
author	Xiaojian Wu Mijin Kim Haoran Qu YuHuang Wang
author_facet	Xiaojian Wu Mijin Kim Haoran Qu YuHuang Wang
author_sort	Xiaojian Wu
title	Single-defect spectroscopy in the shortwave infrared
title_short	Single-defect spectroscopy in the shortwave infrared
title_full	Single-defect spectroscopy in the shortwave infrared
title_fullStr	Single-defect spectroscopy in the shortwave infrared
title_full_unstemmed	Single-defect spectroscopy in the shortwave infrared
title_sort	single-defect spectroscopy in the shortwave infrared
publisher	Nature Portfolio
publishDate	2019
url	https://doaj.org/article/aac73f45920342b59723b2d72aa06e2e
work_keys_str_mv	AT xiaojianwu singledefectspectroscopyintheshortwaveinfrared AT mijinkim singledefectspectroscopyintheshortwaveinfrared AT haoranqu singledefectspectroscopyintheshortwaveinfrared AT yuhuangwang singledefectspectroscopyintheshortwaveinfrared
_version_	1718382641181360128

Single-defect spectroscopy in the shortwave infrared

Ejemplares similares