Single-defect spectroscopy in the shortwave infrared

Chemical defects endow materials with unique properties but their investigation is challenging due to their small footprint. Here the authors develop a high throughput shortwave infrared spectroscopy method enabling spectral identification and quantitative counting of fluorescent chemical defects at...

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Autores principales: Xiaojian Wu, Mijin Kim, Haoran Qu, YuHuang Wang
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2019
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Q
Acceso en línea:https://doaj.org/article/aac73f45920342b59723b2d72aa06e2e
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