A Study on the Possibility of Measuring Sludge Sedimentation Using Contrast Detection Characteristics of CdS Photoresistors

Although operators periodically measure the sludge volume index (SVI) to stabilize the bioreactor and solid–liquid separation during the wastewater treatment process, there is a problem of inconsistency attributed to the subjective judgment of the operator. This study aims to investigate the possibi...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Seong-Min Hong, Hyun-Ook Kim, Choong-Gon Kim
Formato: article
Lenguaje:EN
Publicado: MDPI AG 2021
Materias:
SVI
T
Acceso en línea:https://doaj.org/article/ab2dc2983cca4187b8dea388f80d4862
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
id oai:doaj.org-article:ab2dc2983cca4187b8dea388f80d4862
record_format dspace
spelling oai:doaj.org-article:ab2dc2983cca4187b8dea388f80d48622021-11-25T17:28:58ZA Study on the Possibility of Measuring Sludge Sedimentation Using Contrast Detection Characteristics of CdS Photoresistors10.3390/en142278171996-1073https://doaj.org/article/ab2dc2983cca4187b8dea388f80d48622021-11-01T00:00:00Zhttps://www.mdpi.com/1996-1073/14/22/7817https://doaj.org/toc/1996-1073Although operators periodically measure the sludge volume index (SVI) to stabilize the bioreactor and solid–liquid separation during the wastewater treatment process, there is a problem of inconsistency attributed to the subjective judgment of the operator. This study aims to investigate the possibility of securing objective data by employing CdS (cadmium–sulfur) photoresistors for SVI measurements. The sedimentation velocity of settling sludge was measured using LED (Light Emitting Diode) lights at the same level as the installed CdS photoresistors. As a result of the experiment, the settling velocity of sludge in the CdS photoresistors’ installation position H1 to H8 (non-flocculent settling), H9 to H12 (discrete flocculent settling) and H13 to H18 (zone settling and compressive settling), was 0.594 mm/s, 0.180 mm/s and 0.056 mm/s, respectively. Through this study, it was confirmed that measuring sludge sedimentation using the CdS photoresistors is possible. If the measurement of solid matter in sludge using several sludge sedimentation measurements is enabled in the future, it will be possible to develop calculation algorithms to measure the SVI.Seong-Min HongHyun-Ook KimChoong-Gon KimMDPI AGarticleCdS photoresistorsludgesedimentationsettlingSVIdeviceTechnologyTENEnergies, Vol 14, Iss 7817, p 7817 (2021)
institution DOAJ
collection DOAJ
language EN
topic CdS photoresistor
sludge
sedimentation
settling
SVI
device
Technology
T
spellingShingle CdS photoresistor
sludge
sedimentation
settling
SVI
device
Technology
T
Seong-Min Hong
Hyun-Ook Kim
Choong-Gon Kim
A Study on the Possibility of Measuring Sludge Sedimentation Using Contrast Detection Characteristics of CdS Photoresistors
description Although operators periodically measure the sludge volume index (SVI) to stabilize the bioreactor and solid–liquid separation during the wastewater treatment process, there is a problem of inconsistency attributed to the subjective judgment of the operator. This study aims to investigate the possibility of securing objective data by employing CdS (cadmium–sulfur) photoresistors for SVI measurements. The sedimentation velocity of settling sludge was measured using LED (Light Emitting Diode) lights at the same level as the installed CdS photoresistors. As a result of the experiment, the settling velocity of sludge in the CdS photoresistors’ installation position H1 to H8 (non-flocculent settling), H9 to H12 (discrete flocculent settling) and H13 to H18 (zone settling and compressive settling), was 0.594 mm/s, 0.180 mm/s and 0.056 mm/s, respectively. Through this study, it was confirmed that measuring sludge sedimentation using the CdS photoresistors is possible. If the measurement of solid matter in sludge using several sludge sedimentation measurements is enabled in the future, it will be possible to develop calculation algorithms to measure the SVI.
format article
author Seong-Min Hong
Hyun-Ook Kim
Choong-Gon Kim
author_facet Seong-Min Hong
Hyun-Ook Kim
Choong-Gon Kim
author_sort Seong-Min Hong
title A Study on the Possibility of Measuring Sludge Sedimentation Using Contrast Detection Characteristics of CdS Photoresistors
title_short A Study on the Possibility of Measuring Sludge Sedimentation Using Contrast Detection Characteristics of CdS Photoresistors
title_full A Study on the Possibility of Measuring Sludge Sedimentation Using Contrast Detection Characteristics of CdS Photoresistors
title_fullStr A Study on the Possibility of Measuring Sludge Sedimentation Using Contrast Detection Characteristics of CdS Photoresistors
title_full_unstemmed A Study on the Possibility of Measuring Sludge Sedimentation Using Contrast Detection Characteristics of CdS Photoresistors
title_sort study on the possibility of measuring sludge sedimentation using contrast detection characteristics of cds photoresistors
publisher MDPI AG
publishDate 2021
url https://doaj.org/article/ab2dc2983cca4187b8dea388f80d4862
work_keys_str_mv AT seongminhong astudyonthepossibilityofmeasuringsludgesedimentationusingcontrastdetectioncharacteristicsofcdsphotoresistors
AT hyunookkim astudyonthepossibilityofmeasuringsludgesedimentationusingcontrastdetectioncharacteristicsofcdsphotoresistors
AT choonggonkim astudyonthepossibilityofmeasuringsludgesedimentationusingcontrastdetectioncharacteristicsofcdsphotoresistors
AT seongminhong studyonthepossibilityofmeasuringsludgesedimentationusingcontrastdetectioncharacteristicsofcdsphotoresistors
AT hyunookkim studyonthepossibilityofmeasuringsludgesedimentationusingcontrastdetectioncharacteristicsofcdsphotoresistors
AT choonggonkim studyonthepossibilityofmeasuringsludgesedimentationusingcontrastdetectioncharacteristicsofcdsphotoresistors
_version_ 1718412304669736960