Role of dislocations in nitride laser diodes with different indium content

Abstract In this work we investigate the role of threading dislocations in nitride light emitters with different indium composition. We compare the properties of laser diodes grown on the low defect density GaN substrate with their counterparts grown on sapphire substrate in the same epitaxial proce...

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Autores principales: Agata Bojarska-Cieślińska, Łucja Marona, Julita Smalc-Koziorowska, Szymon Grzanka, Jan Weyher, Dario Schiavon, Piotr Perlin
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Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/ad1ac300cccf4de3a4f0e4b600d3126c
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spelling oai:doaj.org-article:ad1ac300cccf4de3a4f0e4b600d3126c2021-12-02T15:13:10ZRole of dislocations in nitride laser diodes with different indium content10.1038/s41598-020-79528-z2045-2322https://doaj.org/article/ad1ac300cccf4de3a4f0e4b600d3126c2021-01-01T00:00:00Zhttps://doi.org/10.1038/s41598-020-79528-zhttps://doaj.org/toc/2045-2322Abstract In this work we investigate the role of threading dislocations in nitride light emitters with different indium composition. We compare the properties of laser diodes grown on the low defect density GaN substrate with their counterparts grown on sapphire substrate in the same epitaxial process. All structures were produced by metalorganic vapour phase epitaxy and emit light in the range 383–477 nm. We observe that intensity of electroluminescence is strong in the whole spectral region for devices grown on GaN, but decreases rapidly for the devices on sapphire and emitting at wavelength shorter than 420 nm. We interpret this behaviour in terms of increasing importance of dislocation related nonradiative recombination for low indium content structures. Our studies show that edge dislocations are the main source of nonradiative recombination. We observe that long wavelength emitting structures are characterized by higher average light intensity in cathodoluminescence and better thermal stability. These findings indicate that diffusion path of carriers in these samples is shorter, limiting the amount of carriers reaching nonradiative recombination centers. According to TEM images only mixed dislocations open into the V-pits, usually above the multi quantum wells thus not influencing directly the emission.Agata Bojarska-CieślińskaŁucja MaronaJulita Smalc-KoziorowskaSzymon GrzankaJan WeyherDario SchiavonPiotr PerlinNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 11, Iss 1, Pp 1-8 (2021)
institution DOAJ
collection DOAJ
language EN
topic Medicine
R
Science
Q
spellingShingle Medicine
R
Science
Q
Agata Bojarska-Cieślińska
Łucja Marona
Julita Smalc-Koziorowska
Szymon Grzanka
Jan Weyher
Dario Schiavon
Piotr Perlin
Role of dislocations in nitride laser diodes with different indium content
description Abstract In this work we investigate the role of threading dislocations in nitride light emitters with different indium composition. We compare the properties of laser diodes grown on the low defect density GaN substrate with their counterparts grown on sapphire substrate in the same epitaxial process. All structures were produced by metalorganic vapour phase epitaxy and emit light in the range 383–477 nm. We observe that intensity of electroluminescence is strong in the whole spectral region for devices grown on GaN, but decreases rapidly for the devices on sapphire and emitting at wavelength shorter than 420 nm. We interpret this behaviour in terms of increasing importance of dislocation related nonradiative recombination for low indium content structures. Our studies show that edge dislocations are the main source of nonradiative recombination. We observe that long wavelength emitting structures are characterized by higher average light intensity in cathodoluminescence and better thermal stability. These findings indicate that diffusion path of carriers in these samples is shorter, limiting the amount of carriers reaching nonradiative recombination centers. According to TEM images only mixed dislocations open into the V-pits, usually above the multi quantum wells thus not influencing directly the emission.
format article
author Agata Bojarska-Cieślińska
Łucja Marona
Julita Smalc-Koziorowska
Szymon Grzanka
Jan Weyher
Dario Schiavon
Piotr Perlin
author_facet Agata Bojarska-Cieślińska
Łucja Marona
Julita Smalc-Koziorowska
Szymon Grzanka
Jan Weyher
Dario Schiavon
Piotr Perlin
author_sort Agata Bojarska-Cieślińska
title Role of dislocations in nitride laser diodes with different indium content
title_short Role of dislocations in nitride laser diodes with different indium content
title_full Role of dislocations in nitride laser diodes with different indium content
title_fullStr Role of dislocations in nitride laser diodes with different indium content
title_full_unstemmed Role of dislocations in nitride laser diodes with different indium content
title_sort role of dislocations in nitride laser diodes with different indium content
publisher Nature Portfolio
publishDate 2021
url https://doaj.org/article/ad1ac300cccf4de3a4f0e4b600d3126c
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