Interior point method based contact analysis algorithm for structural analysis of electronic device models

In this paper, we present an algorithm for frictionless contact problems of linear elastic bodies with multi-point constraints. Our algorithm is based on an interior point method and is developed for large scale stress analysis of electronic device models. Electronic devices consist of dozens of thi...

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Autores principales:	Kazuhisa INAGAKI, Gaku HASHIMOTO, Hiroshi OKUDA
Formato:	article
Lenguaje:	EN
Publicado:	The Japan Society of Mechanical Engineers 2015
Materias:	contact problem interior point method finite element method electronic device models Mechanical engineering and machinery TJ1-1570
Acceso en línea:	https://doaj.org/article/ad33b49f45ed4a3e86ed5e34263c39f1
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spelling	oai:doaj.org-article:ad33b49f45ed4a3e86ed5e34263c39f12021-11-26T06:27:48ZInterior point method based contact analysis algorithm for structural analysis of electronic device models2187-974510.1299/mej.15-00146https://doaj.org/article/ad33b49f45ed4a3e86ed5e34263c39f12015-07-01T00:00:00Zhttps://www.jstage.jst.go.jp/article/mej/2/4/2_15-00146/_pdf/-char/enhttps://doaj.org/toc/2187-9745In this paper, we present an algorithm for frictionless contact problems of linear elastic bodies with multi-point constraints. Our algorithm is based on an interior point method and is developed for large scale stress analysis of electronic device models. Electronic devices consist of dozens of thin parts such as liquid crystal displays, printed circuit boards and covers and these parts are placed layer by layer. Therefore, the finite element models contains so many discretized contact constraints and multi-point constraints that make convergence of contact states difficult to achieve. In our algorithm, multi-point constraints are removed by a quadratic penalty method at first, then a primal-dual interior point method is applied. We implemented our algorithm into FrontISTR, which is open-source and large scale finite element structural analysis software, and investigated its performance from simple contact models to actual electronic device models. The numerical experiments show that our algorithm is more efficient than an active set method with an penalty method for large models, although the convergency strongly depends on the parameter settings of a primal-dual interior point method.Kazuhisa INAGAKIGaku HASHIMOTOHiroshi OKUDAThe Japan Society of Mechanical Engineersarticlecontact probleminterior point methodfinite element methodelectronic device modelsMechanical engineering and machineryTJ1-1570ENMechanical Engineering Journal, Vol 2, Iss 4, Pp 15-00146-15-00146 (2015)
institution	DOAJ
collection	DOAJ
language	EN
topic	contact problem interior point method finite element method electronic device models Mechanical engineering and machinery TJ1-1570
spellingShingle	contact problem interior point method finite element method electronic device models Mechanical engineering and machinery TJ1-1570 Kazuhisa INAGAKI Gaku HASHIMOTO Hiroshi OKUDA Interior point method based contact analysis algorithm for structural analysis of electronic device models
description	In this paper, we present an algorithm for frictionless contact problems of linear elastic bodies with multi-point constraints. Our algorithm is based on an interior point method and is developed for large scale stress analysis of electronic device models. Electronic devices consist of dozens of thin parts such as liquid crystal displays, printed circuit boards and covers and these parts are placed layer by layer. Therefore, the finite element models contains so many discretized contact constraints and multi-point constraints that make convergence of contact states difficult to achieve. In our algorithm, multi-point constraints are removed by a quadratic penalty method at first, then a primal-dual interior point method is applied. We implemented our algorithm into FrontISTR, which is open-source and large scale finite element structural analysis software, and investigated its performance from simple contact models to actual electronic device models. The numerical experiments show that our algorithm is more efficient than an active set method with an penalty method for large models, although the convergency strongly depends on the parameter settings of a primal-dual interior point method.
format	article
author	Kazuhisa INAGAKI Gaku HASHIMOTO Hiroshi OKUDA
author_facet	Kazuhisa INAGAKI Gaku HASHIMOTO Hiroshi OKUDA
author_sort	Kazuhisa INAGAKI
title	Interior point method based contact analysis algorithm for structural analysis of electronic device models
title_short	Interior point method based contact analysis algorithm for structural analysis of electronic device models
title_full	Interior point method based contact analysis algorithm for structural analysis of electronic device models
title_fullStr	Interior point method based contact analysis algorithm for structural analysis of electronic device models
title_full_unstemmed	Interior point method based contact analysis algorithm for structural analysis of electronic device models
title_sort	interior point method based contact analysis algorithm for structural analysis of electronic device models
publisher	The Japan Society of Mechanical Engineers
publishDate	2015
url	https://doaj.org/article/ad33b49f45ed4a3e86ed5e34263c39f1
work_keys_str_mv	AT kazuhisainagaki interiorpointmethodbasedcontactanalysisalgorithmforstructuralanalysisofelectronicdevicemodels AT gakuhashimoto interiorpointmethodbasedcontactanalysisalgorithmforstructuralanalysisofelectronicdevicemodels AT hiroshiokuda interiorpointmethodbasedcontactanalysisalgorithmforstructuralanalysisofelectronicdevicemodels
_version_	1718409800874721280

Interior point method based contact analysis algorithm for structural analysis of electronic device models

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