Unlocking new contrast in a scanning helium microscope

Unlocking new contrast in a scanning helium microscope

Scanning helium microscopy uses neutral atoms to image traditionally challenging materials (e.g. delicate, insulating and magnetic samples) non-destructively with absolute surface sensitivity. This work reports the first observation of chemical contrast in helium microscopy via inelastic scattering.

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Detalles Bibliográficos
Autores principales: M. Barr, A. Fahy, J. Martens, A. P. Jardine, D. J. Ward, J. Ellis, W. Allison, P. C. Dastoor
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2016
Materias:
Science
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Acceso en línea:https://doaj.org/article/ad90517c0c8d42b887b502fe1d4561c8
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