Atomic electrostatic maps of 1D channels in 2D semiconductors using 4D scanning transmission electron microscopy
Imaging electrostatic field around individual atoms or defective areas in monolayer 2D materials is crucial to understand their structural coordination. Here, the authors report local changes in specific atomic bonds and provide in-depth structural information of complex defective monolayer MoS2 and...
Guardado en:
Autores principales: | Shiang Fang, Yi Wen, Christopher S. Allen, Colin Ophus, Grace G. D. Han, Angus I. Kirkland, Efthimios Kaxiras, Jamie H. Warner |
---|---|
Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2019
|
Materias: | |
Acceso en línea: | https://doaj.org/article/af7c2e2ed70f4c4787c7fcf3e16555f8 |
Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
Ejemplares similares
-
Anomalous 3D nanoscale photoconduction in hybrid perovskite semiconductors revealed by tomographic atomic force microscopy
por: Jingfeng Song, et al.
Publicado: (2020) -
Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures
por: Liu Zhixin, et al.
Publicado: (2018) -
Correlative 3D microscopy of single cells using super-resolution and scanning ion-conductance microscopy
por: Vytautas Navikas, et al.
Publicado: (2021) -
SCANNING ELECTRON MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF CHITOSAN COMPOSITE FILMS
por: CÁRDENAS,GALO, et al.
Publicado: (2010) -
3D confocal laser-scanning microscopy for large-area imaging of the corneal subbasal nerve plexus
por: Stephan Allgeier, et al.
Publicado: (2018)