Transparency order versus confusion coefficient: a case study of NIST lightweight cryptography S-Boxes

Abstract Side-channel resistance is nowadays widely accepted as a crucial factor in deciding the security assurance level of cryptographic implementations. In most cases, non-linear components (e.g. S-Boxes) of cryptographic algorithms will be chosen as primary targets of side-channel attacks (SCAs)...

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Autores principales: Huizhong Li, Guang Yang, Jingdian Ming, Yongbin Zhou, Chengbin Jin
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Publicado: SpringerOpen 2021
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spelling oai:doaj.org-article:b0b1d614f1d74b77ae41da453f7708d52021-11-08T10:44:50ZTransparency order versus confusion coefficient: a case study of NIST lightweight cryptography S-Boxes10.1186/s42400-021-00099-12523-3246https://doaj.org/article/b0b1d614f1d74b77ae41da453f7708d52021-11-01T00:00:00Zhttps://doi.org/10.1186/s42400-021-00099-1https://doaj.org/toc/2523-3246Abstract Side-channel resistance is nowadays widely accepted as a crucial factor in deciding the security assurance level of cryptographic implementations. In most cases, non-linear components (e.g. S-Boxes) of cryptographic algorithms will be chosen as primary targets of side-channel attacks (SCAs). In order to measure side-channel resistance of S-Boxes, three theoretical metrics are proposed and they are reVisited transparency order (VTO), confusion coefficients variance (CCV), and minimum confusion coefficient (MCC), respectively. However, the practical effectiveness of these metrics remains still unclear. Taking the 4-bit and 8-bit S-Boxes used in NIST Lightweight Cryptography candidates as concrete examples, this paper takes a comprehensive study of the applicability of these metrics. First of all, we empirically investigate the relations among three metrics for targeted S-boxes, and find that CCV is almost linearly correlated with VTO, while MCC is inconsistent with the other two. Furthermore, in order to verify which metric is more effective in which scenarios, we perform simulated and practical experiments on nine 4-bit S-Boxes under the non-profiled attacks and profiled attacks, respectively. The experiments show that for quantifying side-channel resistance of S-Boxes under non-profiled attacks, VTO and CCV are more reliable while MCC fails. We also obtain an interesting observation that none of these three metrics is suitable for measuring the resistance of S-Boxes against profiled SCAs. Finally, we try to verify whether these metrics can be applied to compare the resistance of S-Boxes with different sizes. Unfortunately, all of them are invalid in this scenario.Huizhong LiGuang YangJingdian MingYongbin ZhouChengbin JinSpringerOpenarticleSide-channel attacksNIST lightweight cryptography S-BoxesTransparency orderConfusion coefficientComputer engineering. Computer hardwareTK7885-7895Electronic computers. Computer scienceQA75.5-76.95ENCybersecurity, Vol 4, Iss 1, Pp 1-20 (2021)
institution DOAJ
collection DOAJ
language EN
topic Side-channel attacks
NIST lightweight cryptography S-Boxes
Transparency order
Confusion coefficient
Computer engineering. Computer hardware
TK7885-7895
Electronic computers. Computer science
QA75.5-76.95
spellingShingle Side-channel attacks
NIST lightweight cryptography S-Boxes
Transparency order
Confusion coefficient
Computer engineering. Computer hardware
TK7885-7895
Electronic computers. Computer science
QA75.5-76.95
Huizhong Li
Guang Yang
Jingdian Ming
Yongbin Zhou
Chengbin Jin
Transparency order versus confusion coefficient: a case study of NIST lightweight cryptography S-Boxes
description Abstract Side-channel resistance is nowadays widely accepted as a crucial factor in deciding the security assurance level of cryptographic implementations. In most cases, non-linear components (e.g. S-Boxes) of cryptographic algorithms will be chosen as primary targets of side-channel attacks (SCAs). In order to measure side-channel resistance of S-Boxes, three theoretical metrics are proposed and they are reVisited transparency order (VTO), confusion coefficients variance (CCV), and minimum confusion coefficient (MCC), respectively. However, the practical effectiveness of these metrics remains still unclear. Taking the 4-bit and 8-bit S-Boxes used in NIST Lightweight Cryptography candidates as concrete examples, this paper takes a comprehensive study of the applicability of these metrics. First of all, we empirically investigate the relations among three metrics for targeted S-boxes, and find that CCV is almost linearly correlated with VTO, while MCC is inconsistent with the other two. Furthermore, in order to verify which metric is more effective in which scenarios, we perform simulated and practical experiments on nine 4-bit S-Boxes under the non-profiled attacks and profiled attacks, respectively. The experiments show that for quantifying side-channel resistance of S-Boxes under non-profiled attacks, VTO and CCV are more reliable while MCC fails. We also obtain an interesting observation that none of these three metrics is suitable for measuring the resistance of S-Boxes against profiled SCAs. Finally, we try to verify whether these metrics can be applied to compare the resistance of S-Boxes with different sizes. Unfortunately, all of them are invalid in this scenario.
format article
author Huizhong Li
Guang Yang
Jingdian Ming
Yongbin Zhou
Chengbin Jin
author_facet Huizhong Li
Guang Yang
Jingdian Ming
Yongbin Zhou
Chengbin Jin
author_sort Huizhong Li
title Transparency order versus confusion coefficient: a case study of NIST lightweight cryptography S-Boxes
title_short Transparency order versus confusion coefficient: a case study of NIST lightweight cryptography S-Boxes
title_full Transparency order versus confusion coefficient: a case study of NIST lightweight cryptography S-Boxes
title_fullStr Transparency order versus confusion coefficient: a case study of NIST lightweight cryptography S-Boxes
title_full_unstemmed Transparency order versus confusion coefficient: a case study of NIST lightweight cryptography S-Boxes
title_sort transparency order versus confusion coefficient: a case study of nist lightweight cryptography s-boxes
publisher SpringerOpen
publishDate 2021
url https://doaj.org/article/b0b1d614f1d74b77ae41da453f7708d5
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