Efficient few-shot machine learning for classification of EBSD patterns

Abstract Deep learning is quickly becoming a standard approach to solving a range of materials science objectives, particularly in the field of computer vision. However, labeled datasets large enough to train neural networks from scratch can be challenging to collect. One approach to accelerating th...

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Autores principales: Kevin Kaufmann, Hobson Lane, Xiao Liu, Kenneth S. Vecchio
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/b1148711719344a495d8dd02d6386f09
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