Crop Type Mapping from Optical and Radar Time Series Using Attention-Based Deep Learning

Crop maps are key inputs for crop inventory production and yield estimation and can inform the implementation of effective farm management practices. Producing these maps at detailed scales requires exhaustive field surveys that can be laborious, time-consuming, and expensive to replicate. With a gr...

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Autores principales: Stella Ofori-Ampofo, Charlotte Pelletier, Stefan Lang
Formato: article
Lenguaje:EN
Publicado: MDPI AG 2021
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Acceso en línea:https://doaj.org/article/b24982d8450a4ddfb4df3768aae07893
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