Lu, X. (2021). Simulation of infrared spectra of trace impurities in silicon wafers based on the multiple transmission–reflection infrared method. Nature Portfolio.
Chicago Style (17th ed.) CitationLu, Xiaobin. Simulation of Infrared Spectra of Trace Impurities in Silicon Wafers Based on the Multiple Transmission–reflection Infrared Method. Nature Portfolio, 2021.
MLA (8th ed.) CitationLu, Xiaobin. Simulation of Infrared Spectra of Trace Impurities in Silicon Wafers Based on the Multiple Transmission–reflection Infrared Method. Nature Portfolio, 2021.
Warning: These citations may not always be 100% accurate.