Lu, X. (2021). Simulation of infrared spectra of trace impurities in silicon wafers based on the multiple transmission–reflection infrared method. Nature Portfolio.
Cita Chicago Style (17a ed.)Lu, Xiaobin. Simulation of Infrared Spectra of Trace Impurities in Silicon Wafers Based on the Multiple Transmission–reflection Infrared Method. Nature Portfolio, 2021.
Cita MLA (8a ed.)Lu, Xiaobin. Simulation of Infrared Spectra of Trace Impurities in Silicon Wafers Based on the Multiple Transmission–reflection Infrared Method. Nature Portfolio, 2021.
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