Material Characterization and Radio Channel Modeling at D-Band Frequencies

As the throughput requirements for wireless communication links keep rising, characterization of sub-THz radio channels is necessary. This paper presents the results of a radio channel measurement campaign in which we characterize the full D-band, ranging from 110 to 170 GHz, for distances up to 5 m...

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Autores principales: Brecht De Beelde, David Plets, Claude Desset, Emmeric Tanghe, Andre Bourdoux, Wout Joseph
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Lenguaje:EN
Publicado: IEEE 2021
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Acceso en línea:https://doaj.org/article/b5dd14fa50d8417194176e94e0c782e4
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spelling oai:doaj.org-article:b5dd14fa50d8417194176e94e0c782e42021-11-24T00:02:49ZMaterial Characterization and Radio Channel Modeling at D-Band Frequencies2169-353610.1109/ACCESS.2021.3127399https://doaj.org/article/b5dd14fa50d8417194176e94e0c782e42021-01-01T00:00:00Zhttps://ieeexplore.ieee.org/document/9611219/https://doaj.org/toc/2169-3536As the throughput requirements for wireless communication links keep rising, characterization of sub-THz radio channels is necessary. This paper presents the results of a radio channel measurement campaign in which we characterize the full D-band, ranging from 110 to 170 GHz, for distances up to 5 m. We measured penetration and reflection loss for a broad set of materials that are commonly used in indoor environments, including wood, glass, acrylic, and concrete, and measured corner diffraction losses. Measurements over the full 60 GHz bandwidth reveal frequency selectivity as well as a periodic variation of both penetration and reflection loss, which is attributed to the thin film effect. Based on measurements in a conference room and outdoors, we create a spatio-temporal channel model for the conference room and an outdoor path loss model. The channel models show that the radio channel is extremely sparse to multipath components, containing only a Line-of-Sight path with signal attenuation close to path loss in free space, and first-order reflections with a measured attenuation that corresponds to the sum of the path and reflection loss.Brecht De BeeldeDavid PletsClaude DessetEmmeric TangheAndre BourdouxWout JosephIEEEarticleChannel characterizationD-banddiffractionmillimeter wave propagationmodelingpath lossElectrical engineering. Electronics. Nuclear engineeringTK1-9971ENIEEE Access, Vol 9, Pp 153528-153539 (2021)
institution DOAJ
collection DOAJ
language EN
topic Channel characterization
D-band
diffraction
millimeter wave propagation
modeling
path loss
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
spellingShingle Channel characterization
D-band
diffraction
millimeter wave propagation
modeling
path loss
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
Brecht De Beelde
David Plets
Claude Desset
Emmeric Tanghe
Andre Bourdoux
Wout Joseph
Material Characterization and Radio Channel Modeling at D-Band Frequencies
description As the throughput requirements for wireless communication links keep rising, characterization of sub-THz radio channels is necessary. This paper presents the results of a radio channel measurement campaign in which we characterize the full D-band, ranging from 110 to 170 GHz, for distances up to 5 m. We measured penetration and reflection loss for a broad set of materials that are commonly used in indoor environments, including wood, glass, acrylic, and concrete, and measured corner diffraction losses. Measurements over the full 60 GHz bandwidth reveal frequency selectivity as well as a periodic variation of both penetration and reflection loss, which is attributed to the thin film effect. Based on measurements in a conference room and outdoors, we create a spatio-temporal channel model for the conference room and an outdoor path loss model. The channel models show that the radio channel is extremely sparse to multipath components, containing only a Line-of-Sight path with signal attenuation close to path loss in free space, and first-order reflections with a measured attenuation that corresponds to the sum of the path and reflection loss.
format article
author Brecht De Beelde
David Plets
Claude Desset
Emmeric Tanghe
Andre Bourdoux
Wout Joseph
author_facet Brecht De Beelde
David Plets
Claude Desset
Emmeric Tanghe
Andre Bourdoux
Wout Joseph
author_sort Brecht De Beelde
title Material Characterization and Radio Channel Modeling at D-Band Frequencies
title_short Material Characterization and Radio Channel Modeling at D-Band Frequencies
title_full Material Characterization and Radio Channel Modeling at D-Band Frequencies
title_fullStr Material Characterization and Radio Channel Modeling at D-Band Frequencies
title_full_unstemmed Material Characterization and Radio Channel Modeling at D-Band Frequencies
title_sort material characterization and radio channel modeling at d-band frequencies
publisher IEEE
publishDate 2021
url https://doaj.org/article/b5dd14fa50d8417194176e94e0c782e4
work_keys_str_mv AT brechtdebeelde materialcharacterizationandradiochannelmodelingatdbandfrequencies
AT davidplets materialcharacterizationandradiochannelmodelingatdbandfrequencies
AT claudedesset materialcharacterizationandradiochannelmodelingatdbandfrequencies
AT emmerictanghe materialcharacterizationandradiochannelmodelingatdbandfrequencies
AT andrebourdoux materialcharacterizationandradiochannelmodelingatdbandfrequencies
AT woutjoseph materialcharacterizationandradiochannelmodelingatdbandfrequencies
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