Material Characterization and Radio Channel Modeling at D-Band Frequencies
As the throughput requirements for wireless communication links keep rising, characterization of sub-THz radio channels is necessary. This paper presents the results of a radio channel measurement campaign in which we characterize the full D-band, ranging from 110 to 170 GHz, for distances up to 5 m...
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IEEE
2021
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oai:doaj.org-article:b5dd14fa50d8417194176e94e0c782e42021-11-24T00:02:49ZMaterial Characterization and Radio Channel Modeling at D-Band Frequencies2169-353610.1109/ACCESS.2021.3127399https://doaj.org/article/b5dd14fa50d8417194176e94e0c782e42021-01-01T00:00:00Zhttps://ieeexplore.ieee.org/document/9611219/https://doaj.org/toc/2169-3536As the throughput requirements for wireless communication links keep rising, characterization of sub-THz radio channels is necessary. This paper presents the results of a radio channel measurement campaign in which we characterize the full D-band, ranging from 110 to 170 GHz, for distances up to 5 m. We measured penetration and reflection loss for a broad set of materials that are commonly used in indoor environments, including wood, glass, acrylic, and concrete, and measured corner diffraction losses. Measurements over the full 60 GHz bandwidth reveal frequency selectivity as well as a periodic variation of both penetration and reflection loss, which is attributed to the thin film effect. Based on measurements in a conference room and outdoors, we create a spatio-temporal channel model for the conference room and an outdoor path loss model. The channel models show that the radio channel is extremely sparse to multipath components, containing only a Line-of-Sight path with signal attenuation close to path loss in free space, and first-order reflections with a measured attenuation that corresponds to the sum of the path and reflection loss.Brecht De BeeldeDavid PletsClaude DessetEmmeric TangheAndre BourdouxWout JosephIEEEarticleChannel characterizationD-banddiffractionmillimeter wave propagationmodelingpath lossElectrical engineering. Electronics. Nuclear engineeringTK1-9971ENIEEE Access, Vol 9, Pp 153528-153539 (2021) |
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Channel characterization D-band diffraction millimeter wave propagation modeling path loss Electrical engineering. Electronics. Nuclear engineering TK1-9971 |
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Channel characterization D-band diffraction millimeter wave propagation modeling path loss Electrical engineering. Electronics. Nuclear engineering TK1-9971 Brecht De Beelde David Plets Claude Desset Emmeric Tanghe Andre Bourdoux Wout Joseph Material Characterization and Radio Channel Modeling at D-Band Frequencies |
description |
As the throughput requirements for wireless communication links keep rising, characterization of sub-THz radio channels is necessary. This paper presents the results of a radio channel measurement campaign in which we characterize the full D-band, ranging from 110 to 170 GHz, for distances up to 5 m. We measured penetration and reflection loss for a broad set of materials that are commonly used in indoor environments, including wood, glass, acrylic, and concrete, and measured corner diffraction losses. Measurements over the full 60 GHz bandwidth reveal frequency selectivity as well as a periodic variation of both penetration and reflection loss, which is attributed to the thin film effect. Based on measurements in a conference room and outdoors, we create a spatio-temporal channel model for the conference room and an outdoor path loss model. The channel models show that the radio channel is extremely sparse to multipath components, containing only a Line-of-Sight path with signal attenuation close to path loss in free space, and first-order reflections with a measured attenuation that corresponds to the sum of the path and reflection loss. |
format |
article |
author |
Brecht De Beelde David Plets Claude Desset Emmeric Tanghe Andre Bourdoux Wout Joseph |
author_facet |
Brecht De Beelde David Plets Claude Desset Emmeric Tanghe Andre Bourdoux Wout Joseph |
author_sort |
Brecht De Beelde |
title |
Material Characterization and Radio Channel Modeling at D-Band Frequencies |
title_short |
Material Characterization and Radio Channel Modeling at D-Band Frequencies |
title_full |
Material Characterization and Radio Channel Modeling at D-Band Frequencies |
title_fullStr |
Material Characterization and Radio Channel Modeling at D-Band Frequencies |
title_full_unstemmed |
Material Characterization and Radio Channel Modeling at D-Band Frequencies |
title_sort |
material characterization and radio channel modeling at d-band frequencies |
publisher |
IEEE |
publishDate |
2021 |
url |
https://doaj.org/article/b5dd14fa50d8417194176e94e0c782e4 |
work_keys_str_mv |
AT brechtdebeelde materialcharacterizationandradiochannelmodelingatdbandfrequencies AT davidplets materialcharacterizationandradiochannelmodelingatdbandfrequencies AT claudedesset materialcharacterizationandradiochannelmodelingatdbandfrequencies AT emmerictanghe materialcharacterizationandradiochannelmodelingatdbandfrequencies AT andrebourdoux materialcharacterizationandradiochannelmodelingatdbandfrequencies AT woutjoseph materialcharacterizationandradiochannelmodelingatdbandfrequencies |
_version_ |
1718416116237205504 |