Scanning tunnelling microscope light emission: Finite temperature current noise and over cut-off emission

Abstract The spectral distribution of light emitted from a scanning tunnelling microscope junction not only bears its intrinsic plasmonic signature but is also imprinted with the characteristics of optical frequency fluc- tuations of the tunnel current. Experimental spectra from gold-gold tunnel jun...

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Autores principales:	Vijith Kalathingal, Paul Dawson, J. Mitra
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/b6764f7c5cfa4a57927982655ee30035
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spelling	oai:doaj.org-article:b6764f7c5cfa4a57927982655ee300352021-12-02T15:05:33ZScanning tunnelling microscope light emission: Finite temperature current noise and over cut-off emission10.1038/s41598-017-03766-x2045-2322https://doaj.org/article/b6764f7c5cfa4a57927982655ee300352017-06-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-03766-xhttps://doaj.org/toc/2045-2322Abstract The spectral distribution of light emitted from a scanning tunnelling microscope junction not only bears its intrinsic plasmonic signature but is also imprinted with the characteristics of optical frequency fluc- tuations of the tunnel current. Experimental spectra from gold-gold tunnel junctions are presented that show a strong bias (V b ) dependence, curiously with emission at energies higher than the quantum cut-off (eV b ); a component that decays monotonically with increasing bias. The spectral evolution is explained by developing a theoretical model for the power spectral density of tunnel current fluctuations, incorporating finite temperature contribution through consideration of the quantum transport in the system. Notably, the observed decay of the over cut-off emission is found to be critically associated with, and well explained in terms of the variation in junction conductance with V b . The investigation highlights the scope of plasmon-mediated light emission as a unique probe of high frequency fluctuations in electronic systems that are fundamental to the electrical generation and control of plasmons.Vijith KalathingalPaul DawsonJ. MitraNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-10 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Vijith Kalathingal Paul Dawson J. Mitra Scanning tunnelling microscope light emission: Finite temperature current noise and over cut-off emission
description	Abstract The spectral distribution of light emitted from a scanning tunnelling microscope junction not only bears its intrinsic plasmonic signature but is also imprinted with the characteristics of optical frequency fluc- tuations of the tunnel current. Experimental spectra from gold-gold tunnel junctions are presented that show a strong bias (V b ) dependence, curiously with emission at energies higher than the quantum cut-off (eV b ); a component that decays monotonically with increasing bias. The spectral evolution is explained by developing a theoretical model for the power spectral density of tunnel current fluctuations, incorporating finite temperature contribution through consideration of the quantum transport in the system. Notably, the observed decay of the over cut-off emission is found to be critically associated with, and well explained in terms of the variation in junction conductance with V b . The investigation highlights the scope of plasmon-mediated light emission as a unique probe of high frequency fluctuations in electronic systems that are fundamental to the electrical generation and control of plasmons.
format	article
author	Vijith Kalathingal Paul Dawson J. Mitra
author_facet	Vijith Kalathingal Paul Dawson J. Mitra
author_sort	Vijith Kalathingal
title	Scanning tunnelling microscope light emission: Finite temperature current noise and over cut-off emission
title_short	Scanning tunnelling microscope light emission: Finite temperature current noise and over cut-off emission
title_full	Scanning tunnelling microscope light emission: Finite temperature current noise and over cut-off emission
title_fullStr	Scanning tunnelling microscope light emission: Finite temperature current noise and over cut-off emission
title_full_unstemmed	Scanning tunnelling microscope light emission: Finite temperature current noise and over cut-off emission
title_sort	scanning tunnelling microscope light emission: finite temperature current noise and over cut-off emission
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/b6764f7c5cfa4a57927982655ee30035
work_keys_str_mv	AT vijithkalathingal scanningtunnellingmicroscopelightemissionfinitetemperaturecurrentnoiseandovercutoffemission AT pauldawson scanningtunnellingmicroscopelightemissionfinitetemperaturecurrentnoiseandovercutoffemission AT jmitra scanningtunnellingmicroscopelightemissionfinitetemperaturecurrentnoiseandovercutoffemission
_version_	1718388789203697664

Scanning tunnelling microscope light emission: Finite temperature current noise and over cut-off emission

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