Krishnan, U. S. S., & Palanisamy, K. (2021). Recycled integrated circuit detection using reliability analysis and machine learning algorithms. Wiley.
Cita Chicago Style (17a ed.)Krishnan, Udaya Shankar Santhana, y Kalpana Palanisamy. Recycled Integrated Circuit Detection Using Reliability Analysis and Machine Learning Algorithms. Wiley, 2021.
Cita MLA (8a ed.)Krishnan, Udaya Shankar Santhana, y Kalpana Palanisamy. Recycled Integrated Circuit Detection Using Reliability Analysis and Machine Learning Algorithms. Wiley, 2021.
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