Krishnan, U. S. S., & Palanisamy, K. (2021). Recycled integrated circuit detection using reliability analysis and machine learning algorithms. Wiley.
Style de citation Chicago (17e éd.)Krishnan, Udaya Shankar Santhana, et Kalpana Palanisamy. Recycled Integrated Circuit Detection Using Reliability Analysis and Machine Learning Algorithms. Wiley, 2021.
Style de citation MLA (8e éd.)Krishnan, Udaya Shankar Santhana, et Kalpana Palanisamy. Recycled Integrated Circuit Detection Using Reliability Analysis and Machine Learning Algorithms. Wiley, 2021.
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