Recycled integrated circuit detection using reliability analysis and machine learning algorithms
Abstract The use of counterfeit integrated circuits (ICs) in electronic products decreases its quality and lifetime. Recycled ICs can be detected by the method of aging analysis. Aging is carried out through reliability analysis with the effect of hot carrier injection and bias temperature instabili...
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| Auteurs principaux: | , |
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| Format: | article |
| Langue: | EN |
| Publié: |
Wiley
2021
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| Accès en ligne: | https://doaj.org/article/b68c0ec3f79f4426b0c6acd73020ef89 |
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