Study the Structure Properties of Semiconductor Film Multilayered

In this research was study the effect of increasing the number of layers of the semiconductor films as PbS on the average grain sizes and illustrate the relationship between the increase in the average grain size and thickness of the membrane, and membrane was prepared using the easy and simple and...

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Autores principales:	Hind Basil Al-Atraqji, Hanaa Arer Al.Kaisy
Formato:	article
Lenguaje:	EN
Publicado:	Al-Khwarizmi College of Engineering – University of Baghdad 2010
Materias:	Chemical engineering TP155-156 Engineering (General). Civil engineering (General) TA1-2040
Acceso en línea:	https://doaj.org/article/b6cb816335ea48678f7ac021202e356b
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spelling	oai:doaj.org-article:b6cb816335ea48678f7ac021202e356b2021-12-02T07:16:38ZStudy the Structure Properties of Semiconductor Film Multilayered1818-11712312-0789https://doaj.org/article/b6cb816335ea48678f7ac021202e356b2010-06-01T00:00:00Zhttp://alkej.uobaghdad.edu.iq/index.php/alkej/article/view/492https://doaj.org/toc/1818-1171https://doaj.org/toc/2312-0789 In this research was study the effect of increasing the number of layers of the semiconductor films as PbS on the average grain sizes and illustrate the relationship between the increase in the average grain size and thickness of the membrane, and membrane was prepared using the easy and simple and does not need the complexity of which is that the chemical bath , and from an X-ray diffraction found that the material and the installation of a random cubic and when increasing the number of layers deposited note the emergence of a number of vertices of a substance and PbS at different levels but the level is more severe (200) as well as the value is calculated optical energy gap and found to be not affected by increase thickness and from this value can be determined the applications of semiconductor materials and elected on the basis of Article absorbed optical radiation that incident on them. Hind Basil Al-AtraqjiHanaa Arer Al.KaisyAl-Khwarizmi College of Engineering – University of BaghdadarticleChemical engineeringTP155-156Engineering (General). Civil engineering (General)TA1-2040ENAl-Khawarizmi Engineering Journal, Vol 6, Iss 2 (2010)
institution	DOAJ
collection	DOAJ
language	EN
topic	Chemical engineering TP155-156 Engineering (General). Civil engineering (General) TA1-2040
spellingShingle	Chemical engineering TP155-156 Engineering (General). Civil engineering (General) TA1-2040 Hind Basil Al-Atraqji Hanaa Arer Al.Kaisy Study the Structure Properties of Semiconductor Film Multilayered
description	In this research was study the effect of increasing the number of layers of the semiconductor films as PbS on the average grain sizes and illustrate the relationship between the increase in the average grain size and thickness of the membrane, and membrane was prepared using the easy and simple and does not need the complexity of which is that the chemical bath , and from an X-ray diffraction found that the material and the installation of a random cubic and when increasing the number of layers deposited note the emergence of a number of vertices of a substance and PbS at different levels but the level is more severe (200) as well as the value is calculated optical energy gap and found to be not affected by increase thickness and from this value can be determined the applications of semiconductor materials and elected on the basis of Article absorbed optical radiation that incident on them.
format	article
author	Hind Basil Al-Atraqji Hanaa Arer Al.Kaisy
author_facet	Hind Basil Al-Atraqji Hanaa Arer Al.Kaisy
author_sort	Hind Basil Al-Atraqji
title	Study the Structure Properties of Semiconductor Film Multilayered
title_short	Study the Structure Properties of Semiconductor Film Multilayered
title_full	Study the Structure Properties of Semiconductor Film Multilayered
title_fullStr	Study the Structure Properties of Semiconductor Film Multilayered
title_full_unstemmed	Study the Structure Properties of Semiconductor Film Multilayered
title_sort	study the structure properties of semiconductor film multilayered
publisher	Al-Khwarizmi College of Engineering – University of Baghdad
publishDate	2010
url	https://doaj.org/article/b6cb816335ea48678f7ac021202e356b
work_keys_str_mv	AT hindbasilalatraqji studythestructurepropertiesofsemiconductorfilmmultilayered AT hanaaareralkaisy studythestructurepropertiesofsemiconductorfilmmultilayered
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Study the Structure Properties of Semiconductor Film Multilayered

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