The effect of charge transfer transition on the photostability of lanthanide-doped indium oxide thin-film transistors

Thin-film transistors based on amorphous oxide semiconductors have promising applications, but their stability is hampered by negative bias illumination stress. Here, a systematic study of lanthanide-doped indium oxide semiconductors reveals that Pr and Tb are most efficient in improving the photost...

Description complète

Enregistré dans:
Détails bibliographiques
Auteurs principaux: Penghui He, Hua Xu, Linfeng Lan, Caihao Deng, Yongbo Wu, Yilong Lin, Siting Chen, Chunchun Ding, Xiao Li, Miao Xu, Junbiao Peng
Format: article
Langue:EN
Publié: Nature Portfolio 2021
Sujets:
Accès en ligne:https://doaj.org/article/b86d8a8fc68c495089cc6be2c7db0571
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!