Objective Bayesian Estimation for Tweedie Exponential Dispersion Process

An objective Bayesian method for the Tweedie Exponential Dispersion (TED) process model is proposed in this paper. The TED process is a generalized stochastic process, including some famous stochastic processes (e.g., Wiener, Gamma, and Inverse Gaussian processes) as special cases. This characterist...

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Autores principales: Weian Yan, Shijie Zhang, Weidong Liu, Yingxia Yu
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Lenguaje:EN
Publicado: MDPI AG 2021
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Acceso en línea:https://doaj.org/article/b9b49570986543abae5e7311a19b3f30
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spelling oai:doaj.org-article:b9b49570986543abae5e7311a19b3f302021-11-11T18:17:21ZObjective Bayesian Estimation for Tweedie Exponential Dispersion Process10.3390/math92127402227-7390https://doaj.org/article/b9b49570986543abae5e7311a19b3f302021-10-01T00:00:00Zhttps://www.mdpi.com/2227-7390/9/21/2740https://doaj.org/toc/2227-7390An objective Bayesian method for the Tweedie Exponential Dispersion (TED) process model is proposed in this paper. The TED process is a generalized stochastic process, including some famous stochastic processes (e.g., Wiener, Gamma, and Inverse Gaussian processes) as special cases. This characteristic model of several types of process, to be more generic, is of particular use for degradation data analysis. At present, the estimation methods of the TED model are the subjective Bayesian method or the frequentist method. However, some products may not have historical information for reference and the sample size is small, which will lead to a dilemma for the frequentist method and subjective Bayesian method. Therefore, we propose an objective Bayesian method to analyze the TED model. Furthermore, we prove that the corresponding posterior distributions have nice properties and propose Metropolis–Hastings algorithms for the Bayesian inference. To illustrate the applicability and advantages of the TED model and objective Bayesian method, we compare the objective Bayesian estimates with the subjective Bayesian estimates and the maximum likelihood estimates according to Monte Carlo simulations. Finally, a case of GaAs laser data is used to illustrate the effectiveness of the proposed methods.Weian YanShijie ZhangWeidong LiuYingxia YuMDPI AGarticleTweedie Exponential Dispersion processobjective BayesiandegradationMetropolis–Hastings algorithmreference priorMathematicsQA1-939ENMathematics, Vol 9, Iss 2740, p 2740 (2021)
institution DOAJ
collection DOAJ
language EN
topic Tweedie Exponential Dispersion process
objective Bayesian
degradation
Metropolis–Hastings algorithm
reference prior
Mathematics
QA1-939
spellingShingle Tweedie Exponential Dispersion process
objective Bayesian
degradation
Metropolis–Hastings algorithm
reference prior
Mathematics
QA1-939
Weian Yan
Shijie Zhang
Weidong Liu
Yingxia Yu
Objective Bayesian Estimation for Tweedie Exponential Dispersion Process
description An objective Bayesian method for the Tweedie Exponential Dispersion (TED) process model is proposed in this paper. The TED process is a generalized stochastic process, including some famous stochastic processes (e.g., Wiener, Gamma, and Inverse Gaussian processes) as special cases. This characteristic model of several types of process, to be more generic, is of particular use for degradation data analysis. At present, the estimation methods of the TED model are the subjective Bayesian method or the frequentist method. However, some products may not have historical information for reference and the sample size is small, which will lead to a dilemma for the frequentist method and subjective Bayesian method. Therefore, we propose an objective Bayesian method to analyze the TED model. Furthermore, we prove that the corresponding posterior distributions have nice properties and propose Metropolis–Hastings algorithms for the Bayesian inference. To illustrate the applicability and advantages of the TED model and objective Bayesian method, we compare the objective Bayesian estimates with the subjective Bayesian estimates and the maximum likelihood estimates according to Monte Carlo simulations. Finally, a case of GaAs laser data is used to illustrate the effectiveness of the proposed methods.
format article
author Weian Yan
Shijie Zhang
Weidong Liu
Yingxia Yu
author_facet Weian Yan
Shijie Zhang
Weidong Liu
Yingxia Yu
author_sort Weian Yan
title Objective Bayesian Estimation for Tweedie Exponential Dispersion Process
title_short Objective Bayesian Estimation for Tweedie Exponential Dispersion Process
title_full Objective Bayesian Estimation for Tweedie Exponential Dispersion Process
title_fullStr Objective Bayesian Estimation for Tweedie Exponential Dispersion Process
title_full_unstemmed Objective Bayesian Estimation for Tweedie Exponential Dispersion Process
title_sort objective bayesian estimation for tweedie exponential dispersion process
publisher MDPI AG
publishDate 2021
url https://doaj.org/article/b9b49570986543abae5e7311a19b3f30
work_keys_str_mv AT weianyan objectivebayesianestimationfortweedieexponentialdispersionprocess
AT shijiezhang objectivebayesianestimationfortweedieexponentialdispersionprocess
AT weidongliu objectivebayesianestimationfortweedieexponentialdispersionprocess
AT yingxiayu objectivebayesianestimationfortweedieexponentialdispersionprocess
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