Quantum advantage in postselected metrology

In quantum metrology (as well as computing) it is not easy to pinpoint the specific source of quantum advantage. Here, the authors reveal a link between postselection and the unusually high rates of information per final measurement in general quantum parameter-estimation scenarios.

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Autores principales:	David R. M. Arvidsson-Shukur, Nicole Yunger Halpern, Hugo V. Lepage, Aleksander A. Lasek, Crispin H. W. Barnes, Seth Lloyd
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2020
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/ba5f29d271834adeb475aeace53c602b
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spelling	oai:doaj.org-article:ba5f29d271834adeb475aeace53c602b2021-12-02T18:47:02ZQuantum advantage in postselected metrology10.1038/s41467-020-17559-w2041-1723https://doaj.org/article/ba5f29d271834adeb475aeace53c602b2020-07-01T00:00:00Zhttps://doi.org/10.1038/s41467-020-17559-whttps://doaj.org/toc/2041-1723In quantum metrology (as well as computing) it is not easy to pinpoint the specific source of quantum advantage. Here, the authors reveal a link between postselection and the unusually high rates of information per final measurement in general quantum parameter-estimation scenarios.David R. M. Arvidsson-ShukurNicole Yunger HalpernHugo V. LepageAleksander A. LasekCrispin H. W. BarnesSeth LloydNature PortfolioarticleScienceQENNature Communications, Vol 11, Iss 1, Pp 1-7 (2020)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q David R. M. Arvidsson-Shukur Nicole Yunger Halpern Hugo V. Lepage Aleksander A. Lasek Crispin H. W. Barnes Seth Lloyd Quantum advantage in postselected metrology
description	In quantum metrology (as well as computing) it is not easy to pinpoint the specific source of quantum advantage. Here, the authors reveal a link between postselection and the unusually high rates of information per final measurement in general quantum parameter-estimation scenarios.
format	article
author	David R. M. Arvidsson-Shukur Nicole Yunger Halpern Hugo V. Lepage Aleksander A. Lasek Crispin H. W. Barnes Seth Lloyd
author_facet	David R. M. Arvidsson-Shukur Nicole Yunger Halpern Hugo V. Lepage Aleksander A. Lasek Crispin H. W. Barnes Seth Lloyd
author_sort	David R. M. Arvidsson-Shukur
title	Quantum advantage in postselected metrology
title_short	Quantum advantage in postselected metrology
title_full	Quantum advantage in postselected metrology
title_fullStr	Quantum advantage in postselected metrology
title_full_unstemmed	Quantum advantage in postselected metrology
title_sort	quantum advantage in postselected metrology
publisher	Nature Portfolio
publishDate	2020
url	https://doaj.org/article/ba5f29d271834adeb475aeace53c602b
work_keys_str_mv	AT davidrmarvidssonshukur quantumadvantageinpostselectedmetrology AT nicoleyungerhalpern quantumadvantageinpostselectedmetrology AT hugovlepage quantumadvantageinpostselectedmetrology AT aleksanderalasek quantumadvantageinpostselectedmetrology AT crispinhwbarnes quantumadvantageinpostselectedmetrology AT sethlloyd quantumadvantageinpostselectedmetrology
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Quantum advantage in postselected metrology

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