Quantum advantage in postselected metrology
In quantum metrology (as well as computing) it is not easy to pinpoint the specific source of quantum advantage. Here, the authors reveal a link between postselection and the unusually high rates of information per final measurement in general quantum parameter-estimation scenarios.
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| Autores principales: | , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2020
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/ba5f29d271834adeb475aeace53c602b |
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