Surface diffusion-limited lifetime of silver and copper nanofilaments in resistive switching devices
Resistive random-access memory is operated based on the formation and disruption of nanoscale conductive filaments, but a mechanistic understanding of this process remains unclear. Here, Wang et al. develop a surface-diffusion model to describe lifetime of filaments ranging from microseconds to year...
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| Autores principales: | , , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2019
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/bb61f6f7fd6e454bbaaca9088c9120c8 |
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| Sumario: | Resistive random-access memory is operated based on the formation and disruption of nanoscale conductive filaments, but a mechanistic understanding of this process remains unclear. Here, Wang et al. develop a surface-diffusion model to describe lifetime of filaments ranging from microseconds to years. |
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