Surface diffusion-limited lifetime of silver and copper nanofilaments in resistive switching devices
Resistive random-access memory is operated based on the formation and disruption of nanoscale conductive filaments, but a mechanistic understanding of this process remains unclear. Here, Wang et al. develop a surface-diffusion model to describe lifetime of filaments ranging from microseconds to year...
Guardado en:
Autores principales: | Wei Wang, Ming Wang, Elia Ambrosi, Alessandro Bricalli, Mario Laudato, Zhong Sun, Xiaodong Chen, Daniele Ielmini |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2019
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Materias: | |
Acceso en línea: | https://doaj.org/article/bb61f6f7fd6e454bbaaca9088c9120c8 |
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