Computer vision distortion correction of scanning probe microscopy images

Abstract Since its inception, scanning probe microscopy (SPM) has established itself as the tool of choice for probing surfaces and functionalities at the nanoscale. Although recent developments in the instrumentation have greatly improved the metrological aspects of SPM, it is still plagued by the...

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Autores principales:	Iaroslav Gaponenko, Philippe Tückmantel, Benedikt Ziegler, Guillaume Rapin, Manisha Chhikara, Patrycja Paruch
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/bb87c9a11aca43469ddb816403fc8f89
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spelling	oai:doaj.org-article:bb87c9a11aca43469ddb816403fc8f892021-12-02T11:53:05ZComputer vision distortion correction of scanning probe microscopy images10.1038/s41598-017-00765-w2045-2322https://doaj.org/article/bb87c9a11aca43469ddb816403fc8f892017-04-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-00765-whttps://doaj.org/toc/2045-2322Abstract Since its inception, scanning probe microscopy (SPM) has established itself as the tool of choice for probing surfaces and functionalities at the nanoscale. Although recent developments in the instrumentation have greatly improved the metrological aspects of SPM, it is still plagued by the drifts and nonlinearities of the piezoelectric actuators underlying the precise nanoscale motion. In this work, we present an innovative computer-vision-based distortion correction algorithm for offline processing of functional SPM measurements, allowing two images to be directly overlaid with minimal error – thus correlating position with time evolution and local functionality. To demonstrate its versatility, the algorithm is applied to two very different systems. First, we show the tracking of polarisation switching in an epitaxial Pb(Zr0.2Ti0.8)O3 thin film during high-speed continuous scanning under applied tip bias. Thanks to the precise time-location-polarisation correlation we can extract the regions of domain nucleation and track the motion of domain walls until the merging of the latter in avalanche-like events. Secondly, the morphology of surface folds and wrinkles in graphene deposited on a PET substrate is probed as a function of applied strain, allowing the relaxation of individual wrinkles to be tracked.Iaroslav GaponenkoPhilippe TückmantelBenedikt ZieglerGuillaume RapinManisha ChhikaraPatrycja ParuchNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-8 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Iaroslav Gaponenko Philippe Tückmantel Benedikt Ziegler Guillaume Rapin Manisha Chhikara Patrycja Paruch Computer vision distortion correction of scanning probe microscopy images
description	Abstract Since its inception, scanning probe microscopy (SPM) has established itself as the tool of choice for probing surfaces and functionalities at the nanoscale. Although recent developments in the instrumentation have greatly improved the metrological aspects of SPM, it is still plagued by the drifts and nonlinearities of the piezoelectric actuators underlying the precise nanoscale motion. In this work, we present an innovative computer-vision-based distortion correction algorithm for offline processing of functional SPM measurements, allowing two images to be directly overlaid with minimal error – thus correlating position with time evolution and local functionality. To demonstrate its versatility, the algorithm is applied to two very different systems. First, we show the tracking of polarisation switching in an epitaxial Pb(Zr0.2Ti0.8)O3 thin film during high-speed continuous scanning under applied tip bias. Thanks to the precise time-location-polarisation correlation we can extract the regions of domain nucleation and track the motion of domain walls until the merging of the latter in avalanche-like events. Secondly, the morphology of surface folds and wrinkles in graphene deposited on a PET substrate is probed as a function of applied strain, allowing the relaxation of individual wrinkles to be tracked.
format	article
author	Iaroslav Gaponenko Philippe Tückmantel Benedikt Ziegler Guillaume Rapin Manisha Chhikara Patrycja Paruch
author_facet	Iaroslav Gaponenko Philippe Tückmantel Benedikt Ziegler Guillaume Rapin Manisha Chhikara Patrycja Paruch
author_sort	Iaroslav Gaponenko
title	Computer vision distortion correction of scanning probe microscopy images
title_short	Computer vision distortion correction of scanning probe microscopy images
title_full	Computer vision distortion correction of scanning probe microscopy images
title_fullStr	Computer vision distortion correction of scanning probe microscopy images
title_full_unstemmed	Computer vision distortion correction of scanning probe microscopy images
title_sort	computer vision distortion correction of scanning probe microscopy images
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/bb87c9a11aca43469ddb816403fc8f89
work_keys_str_mv	AT iaroslavgaponenko computervisiondistortioncorrectionofscanningprobemicroscopyimages AT philippetuckmantel computervisiondistortioncorrectionofscanningprobemicroscopyimages AT benediktziegler computervisiondistortioncorrectionofscanningprobemicroscopyimages AT guillaumerapin computervisiondistortioncorrectionofscanningprobemicroscopyimages AT manishachhikara computervisiondistortioncorrectionofscanningprobemicroscopyimages AT patrycjaparuch computervisiondistortioncorrectionofscanningprobemicroscopyimages
_version_	1718394888766095360

Computer vision distortion correction of scanning probe microscopy images

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