Mechanical cleaning of graphene using in situ electron microscopy
Contamination of 2D materials adversely impacts device performance and calls for cleaning methods down to the atomic scale and over large areas. Here, the authors present a site-specific mechanical cleaning approach capable of cleaning both sides of suspended 2D membranes and achieving atomically cl...
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Autores principales: | Peter Schweizer, Christian Dolle, Daniela Dasler, Gonzalo Abellán, Frank Hauke, Andreas Hirsch, Erdmann Spiecker |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2020
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Materias: | |
Acceso en línea: | https://doaj.org/article/bceb979c9b3245528e032bcbf801fc91 |
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