Dipole orientation analysis without optical simulation: application to thermally activated delayed fluorescence emitters doped in host matrix

Abstract The dipole orientation of guest emitters doped into host matrices is usually investigated by angular dependent photoluminescence (PL) measurements, which acquire an out-of-plane PL radiation pattern of the guest-host thin films. The PL radiation patterns generated by these methods are typic...

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Autores principales:	Takeshi Komino, Yuji Oki, Chihaya Adachi
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/bea80a3df3434363a033f42459661585
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spelling	oai:doaj.org-article:bea80a3df3434363a033f424596615852021-12-02T12:32:52ZDipole orientation analysis without optical simulation: application to thermally activated delayed fluorescence emitters doped in host matrix10.1038/s41598-017-08708-12045-2322https://doaj.org/article/bea80a3df3434363a033f424596615852017-08-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-08708-1https://doaj.org/toc/2045-2322Abstract The dipole orientation of guest emitters doped into host matrices is usually investigated by angular dependent photoluminescence (PL) measurements, which acquire an out-of-plane PL radiation pattern of the guest-host thin films. The PL radiation patterns generated by these methods are typically analysed by optical simulations, which require expertise to perform and interpret in the simulation. In this paper, we developed a method to calculate an orientational order parameter S without the use of full optical simulations. The PL radiation pattern showed a peak intensity (I sp) in the emission direction tilted by 40°–60° from the normal of the thin film surface plane, indicating an inherent dipole orientation of the emitter. Thus, we directly correlated I sp with S. The S − I sp relation was found to depend on the film thickness (d) and refractive indices of the substrate (n sub) and the organic thin film (n org). Hence, S can be simply calculated with information of I sp, d, n sub, and n org. We applied our method to thermally activated delayed fluorescence materials, which are known to be highly efficient electroluminescence emitters. We evaluated S and found that the error of this method, compared with an optical simulation, was less than 0.05.Takeshi KominoYuji OkiChihaya AdachiNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-8 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Takeshi Komino Yuji Oki Chihaya Adachi Dipole orientation analysis without optical simulation: application to thermally activated delayed fluorescence emitters doped in host matrix
description	Abstract The dipole orientation of guest emitters doped into host matrices is usually investigated by angular dependent photoluminescence (PL) measurements, which acquire an out-of-plane PL radiation pattern of the guest-host thin films. The PL radiation patterns generated by these methods are typically analysed by optical simulations, which require expertise to perform and interpret in the simulation. In this paper, we developed a method to calculate an orientational order parameter S without the use of full optical simulations. The PL radiation pattern showed a peak intensity (I sp) in the emission direction tilted by 40°–60° from the normal of the thin film surface plane, indicating an inherent dipole orientation of the emitter. Thus, we directly correlated I sp with S. The S − I sp relation was found to depend on the film thickness (d) and refractive indices of the substrate (n sub) and the organic thin film (n org). Hence, S can be simply calculated with information of I sp, d, n sub, and n org. We applied our method to thermally activated delayed fluorescence materials, which are known to be highly efficient electroluminescence emitters. We evaluated S and found that the error of this method, compared with an optical simulation, was less than 0.05.
format	article
author	Takeshi Komino Yuji Oki Chihaya Adachi
author_facet	Takeshi Komino Yuji Oki Chihaya Adachi
author_sort	Takeshi Komino
title	Dipole orientation analysis without optical simulation: application to thermally activated delayed fluorescence emitters doped in host matrix
title_short	Dipole orientation analysis without optical simulation: application to thermally activated delayed fluorescence emitters doped in host matrix
title_full	Dipole orientation analysis without optical simulation: application to thermally activated delayed fluorescence emitters doped in host matrix
title_fullStr	Dipole orientation analysis without optical simulation: application to thermally activated delayed fluorescence emitters doped in host matrix
title_full_unstemmed	Dipole orientation analysis without optical simulation: application to thermally activated delayed fluorescence emitters doped in host matrix
title_sort	dipole orientation analysis without optical simulation: application to thermally activated delayed fluorescence emitters doped in host matrix
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/bea80a3df3434363a033f42459661585
work_keys_str_mv	AT takeshikomino dipoleorientationanalysiswithoutopticalsimulationapplicationtothermallyactivateddelayedfluorescenceemittersdopedinhostmatrix AT yujioki dipoleorientationanalysiswithoutopticalsimulationapplicationtothermallyactivateddelayedfluorescenceemittersdopedinhostmatrix AT chihayaadachi dipoleorientationanalysiswithoutopticalsimulationapplicationtothermallyactivateddelayedfluorescenceemittersdopedinhostmatrix
_version_	1718393944426938368

Dipole orientation analysis without optical simulation: application to thermally activated delayed fluorescence emitters doped in host matrix

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