Remote-mode microsphere nano-imaging: new boundaries for optical microscopes

Optical microscope is one of the most popular characterization techniques for general purposes in many fields. It is distinguished from the vacuum or tip-based imaging techniques for its flexibility, low cost, and fast speed. However, its resolution limits the functionality of current optical imagin...

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Autores principales:	Chen Lianwei, Zhou Yan, Wu Mengxue, Hong Minghui
Formato:	article
Lenguaje:	EN
Publicado:	Institue of Optics and Electronics, Chinese Academy of Sciences 2018
Materias:	nano-imaging label-free microscopy Optics. Light QC350-467
Acceso en línea:	https://doaj.org/article/beafecaded034bdaa3d5921f0fbc1363
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id	oai:doaj.org-article:beafecaded034bdaa3d5921f0fbc1363
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spelling	oai:doaj.org-article:beafecaded034bdaa3d5921f0fbc13632021-11-11T10:16:51ZRemote-mode microsphere nano-imaging: new boundaries for optical microscopes2096-457910.29026/oea.2018.170001https://doaj.org/article/beafecaded034bdaa3d5921f0fbc13632018-01-01T00:00:00Zhttp://www.oejournal.org/article/doi/10.29026/oea.2018.170001https://doaj.org/toc/2096-4579Optical microscope is one of the most popular characterization techniques for general purposes in many fields. It is distinguished from the vacuum or tip-based imaging techniques for its flexibility, low cost, and fast speed. However, its resolution limits the functionality of current optical imaging performance. While microspheres have been demonstrated for improving the observation power of optical microscope, they are directly deposited on the sample surface and thus the applications are greatly limited. We develop a remote-mode microsphere nano-imaging platform which can scan freely and in real-time across the sample surfaces. It greatly increases the observation power and successfully characterizes various practical samples with the smallest feature size down to 23 nm. This method offers many unique advantages, such as enabling the detection to be non-invasive, dynamic, real-time, and label-free, as well as leading to more functionalities in ambient air and liquid environments, which extends the nano-scale observation power to a broad scope in our life.Chen LianweiZhou YanWu MengxueHong MinghuiInstitue of Optics and Electronics, Chinese Academy of Sciencesarticlenano-imaginglabel-freemicroscopyOptics. LightQC350-467ENOpto-Electronic Advances, Vol 1, Iss 1, Pp 170001-1-170001-7 (2018)
institution	DOAJ
collection	DOAJ
language	EN
topic	nano-imaging label-free microscopy Optics. Light QC350-467
spellingShingle	nano-imaging label-free microscopy Optics. Light QC350-467 Chen Lianwei Zhou Yan Wu Mengxue Hong Minghui Remote-mode microsphere nano-imaging: new boundaries for optical microscopes
description	Optical microscope is one of the most popular characterization techniques for general purposes in many fields. It is distinguished from the vacuum or tip-based imaging techniques for its flexibility, low cost, and fast speed. However, its resolution limits the functionality of current optical imaging performance. While microspheres have been demonstrated for improving the observation power of optical microscope, they are directly deposited on the sample surface and thus the applications are greatly limited. We develop a remote-mode microsphere nano-imaging platform which can scan freely and in real-time across the sample surfaces. It greatly increases the observation power and successfully characterizes various practical samples with the smallest feature size down to 23 nm. This method offers many unique advantages, such as enabling the detection to be non-invasive, dynamic, real-time, and label-free, as well as leading to more functionalities in ambient air and liquid environments, which extends the nano-scale observation power to a broad scope in our life.
format	article
author	Chen Lianwei Zhou Yan Wu Mengxue Hong Minghui
author_facet	Chen Lianwei Zhou Yan Wu Mengxue Hong Minghui
author_sort	Chen Lianwei
title	Remote-mode microsphere nano-imaging: new boundaries for optical microscopes
title_short	Remote-mode microsphere nano-imaging: new boundaries for optical microscopes
title_full	Remote-mode microsphere nano-imaging: new boundaries for optical microscopes
title_fullStr	Remote-mode microsphere nano-imaging: new boundaries for optical microscopes
title_full_unstemmed	Remote-mode microsphere nano-imaging: new boundaries for optical microscopes
title_sort	remote-mode microsphere nano-imaging: new boundaries for optical microscopes
publisher	Institue of Optics and Electronics, Chinese Academy of Sciences
publishDate	2018
url	https://doaj.org/article/beafecaded034bdaa3d5921f0fbc1363
work_keys_str_mv	AT chenlianwei remotemodemicrospherenanoimagingnewboundariesforopticalmicroscopes AT zhouyan remotemodemicrospherenanoimagingnewboundariesforopticalmicroscopes AT wumengxue remotemodemicrospherenanoimagingnewboundariesforopticalmicroscopes AT hongminghui remotemodemicrospherenanoimagingnewboundariesforopticalmicroscopes
_version_	1718439256886607872

Remote-mode microsphere nano-imaging: new boundaries for optical microscopes

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