Quantifying the critical thickness of electron hybridization in spintronics materials

Surface versus bulk effects in electronic structure of spintronics materials are crucial to their applications but are yet well understood. Here the authors experimentally determine the critical thickness that defines the crossover of electron hybridization between surface and bulk for two prototype...

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Autores principales: T. Pincelli, V. Lollobrigida, F. Borgatti, A. Regoutz, B. Gobaut, C. Schlueter, T. -L. Lee, D. J. Payne, M. Oura, K. Tamasaku, A. Y. Petrov, P. Graziosi, F. Miletto Granozio, M. Cavallini, G. Vinai, R. Ciprian, C. H. Back, G. Rossi, M. Taguchi, H. Daimon, G. van der Laan, G. Panaccione
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Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/bf2614b36c5d4746b48db82229579379
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spelling oai:doaj.org-article:bf2614b36c5d4746b48db822295793792021-12-02T15:38:51ZQuantifying the critical thickness of electron hybridization in spintronics materials10.1038/ncomms160512041-1723https://doaj.org/article/bf2614b36c5d4746b48db822295793792017-07-01T00:00:00Zhttps://doi.org/10.1038/ncomms16051https://doaj.org/toc/2041-1723Surface versus bulk effects in electronic structure of spintronics materials are crucial to their applications but are yet well understood. Here the authors experimentally determine the critical thickness that defines the crossover of electron hybridization between surface and bulk for two prototype spintronics materials.T. PincelliV. LollobrigidaF. BorgattiA. RegoutzB. GobautC. SchlueterT. -L. LeeD. J. PayneM. OuraK. TamasakuA. Y. PetrovP. GraziosiF. Miletto GranozioM. CavalliniG. VinaiR. CiprianC. H. BackG. RossiM. TaguchiH. DaimonG. van der LaanG. PanaccioneNature PortfolioarticleScienceQENNature Communications, Vol 8, Iss 1, Pp 1-8 (2017)
institution DOAJ
collection DOAJ
language EN
topic Science
Q
spellingShingle Science
Q
T. Pincelli
V. Lollobrigida
F. Borgatti
A. Regoutz
B. Gobaut
C. Schlueter
T. -L. Lee
D. J. Payne
M. Oura
K. Tamasaku
A. Y. Petrov
P. Graziosi
F. Miletto Granozio
M. Cavallini
G. Vinai
R. Ciprian
C. H. Back
G. Rossi
M. Taguchi
H. Daimon
G. van der Laan
G. Panaccione
Quantifying the critical thickness of electron hybridization in spintronics materials
description Surface versus bulk effects in electronic structure of spintronics materials are crucial to their applications but are yet well understood. Here the authors experimentally determine the critical thickness that defines the crossover of electron hybridization between surface and bulk for two prototype spintronics materials.
format article
author T. Pincelli
V. Lollobrigida
F. Borgatti
A. Regoutz
B. Gobaut
C. Schlueter
T. -L. Lee
D. J. Payne
M. Oura
K. Tamasaku
A. Y. Petrov
P. Graziosi
F. Miletto Granozio
M. Cavallini
G. Vinai
R. Ciprian
C. H. Back
G. Rossi
M. Taguchi
H. Daimon
G. van der Laan
G. Panaccione
author_facet T. Pincelli
V. Lollobrigida
F. Borgatti
A. Regoutz
B. Gobaut
C. Schlueter
T. -L. Lee
D. J. Payne
M. Oura
K. Tamasaku
A. Y. Petrov
P. Graziosi
F. Miletto Granozio
M. Cavallini
G. Vinai
R. Ciprian
C. H. Back
G. Rossi
M. Taguchi
H. Daimon
G. van der Laan
G. Panaccione
author_sort T. Pincelli
title Quantifying the critical thickness of electron hybridization in spintronics materials
title_short Quantifying the critical thickness of electron hybridization in spintronics materials
title_full Quantifying the critical thickness of electron hybridization in spintronics materials
title_fullStr Quantifying the critical thickness of electron hybridization in spintronics materials
title_full_unstemmed Quantifying the critical thickness of electron hybridization in spintronics materials
title_sort quantifying the critical thickness of electron hybridization in spintronics materials
publisher Nature Portfolio
publishDate 2017
url https://doaj.org/article/bf2614b36c5d4746b48db82229579379
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