Quantifying the critical thickness of electron hybridization in spintronics materials
Surface versus bulk effects in electronic structure of spintronics materials are crucial to their applications but are yet well understood. Here the authors experimentally determine the critical thickness that defines the crossover of electron hybridization between surface and bulk for two prototype...
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Nature Portfolio
2017
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oai:doaj.org-article:bf2614b36c5d4746b48db822295793792021-12-02T15:38:51ZQuantifying the critical thickness of electron hybridization in spintronics materials10.1038/ncomms160512041-1723https://doaj.org/article/bf2614b36c5d4746b48db822295793792017-07-01T00:00:00Zhttps://doi.org/10.1038/ncomms16051https://doaj.org/toc/2041-1723Surface versus bulk effects in electronic structure of spintronics materials are crucial to their applications but are yet well understood. Here the authors experimentally determine the critical thickness that defines the crossover of electron hybridization between surface and bulk for two prototype spintronics materials.T. PincelliV. LollobrigidaF. BorgattiA. RegoutzB. GobautC. SchlueterT. -L. LeeD. J. PayneM. OuraK. TamasakuA. Y. PetrovP. GraziosiF. Miletto GranozioM. CavalliniG. VinaiR. CiprianC. H. BackG. RossiM. TaguchiH. DaimonG. van der LaanG. PanaccioneNature PortfolioarticleScienceQENNature Communications, Vol 8, Iss 1, Pp 1-8 (2017) |
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EN |
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Science Q |
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Science Q T. Pincelli V. Lollobrigida F. Borgatti A. Regoutz B. Gobaut C. Schlueter T. -L. Lee D. J. Payne M. Oura K. Tamasaku A. Y. Petrov P. Graziosi F. Miletto Granozio M. Cavallini G. Vinai R. Ciprian C. H. Back G. Rossi M. Taguchi H. Daimon G. van der Laan G. Panaccione Quantifying the critical thickness of electron hybridization in spintronics materials |
description |
Surface versus bulk effects in electronic structure of spintronics materials are crucial to their applications but are yet well understood. Here the authors experimentally determine the critical thickness that defines the crossover of electron hybridization between surface and bulk for two prototype spintronics materials. |
format |
article |
author |
T. Pincelli V. Lollobrigida F. Borgatti A. Regoutz B. Gobaut C. Schlueter T. -L. Lee D. J. Payne M. Oura K. Tamasaku A. Y. Petrov P. Graziosi F. Miletto Granozio M. Cavallini G. Vinai R. Ciprian C. H. Back G. Rossi M. Taguchi H. Daimon G. van der Laan G. Panaccione |
author_facet |
T. Pincelli V. Lollobrigida F. Borgatti A. Regoutz B. Gobaut C. Schlueter T. -L. Lee D. J. Payne M. Oura K. Tamasaku A. Y. Petrov P. Graziosi F. Miletto Granozio M. Cavallini G. Vinai R. Ciprian C. H. Back G. Rossi M. Taguchi H. Daimon G. van der Laan G. Panaccione |
author_sort |
T. Pincelli |
title |
Quantifying the critical thickness of electron hybridization in spintronics materials |
title_short |
Quantifying the critical thickness of electron hybridization in spintronics materials |
title_full |
Quantifying the critical thickness of electron hybridization in spintronics materials |
title_fullStr |
Quantifying the critical thickness of electron hybridization in spintronics materials |
title_full_unstemmed |
Quantifying the critical thickness of electron hybridization in spintronics materials |
title_sort |
quantifying the critical thickness of electron hybridization in spintronics materials |
publisher |
Nature Portfolio |
publishDate |
2017 |
url |
https://doaj.org/article/bf2614b36c5d4746b48db82229579379 |
work_keys_str_mv |
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1718386071759224832 |