Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions
Abstract Secondary electron emission yield from the surface of SiC ceramics induced by Xe17+ ions has been measured as a function of target temperature and incident energy. In the temperature range of 463–659 K, the total yield gradually decreases with increasing target temperature. The decrease is...
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| Autores principales: | , , , , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2017
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/c0bc68c7421e48aab9f0dd8aa843bbcb |
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