Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions
Abstract Secondary electron emission yield from the surface of SiC ceramics induced by Xe17+ ions has been measured as a function of target temperature and incident energy. In the temperature range of 463–659 K, the total yield gradually decreases with increasing target temperature. The decrease is...
Saved in:
| Main Authors: | , , , , , , , , , |
|---|---|
| Format: | article |
| Language: | EN |
| Published: |
Nature Portfolio
2017
|
| Subjects: | |
| Online Access: | https://doaj.org/article/c0bc68c7421e48aab9f0dd8aa843bbcb |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Be the first to leave a comment!