Study on scattering light field distribution of optical element in-surface defects based on Mueller matrix
For precise optical elements, the size of in-surface defects is at the nanometer scale. When incident light illuminates in-surface defects on optical elements, strong diffraction and scattering effects are produced, and this greatly reduces the beam quality in optical systems. In this study, a three...
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| Autores principales: | , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
AIP Publishing LLC
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/c1577f932cbe4608a5d74fe6feafdbed |
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