Cita APA (7a ed.)

Wang, Y., Jin, X., Peng, Y., Luo, J., Zhong, Z., & Yang, J. (2020). Analysis of High-Failure Mechanism Based on Gate-Controlled Device for Electro-Static Discharge Protection. IEEE.

Cita Chicago Style (17a ed.)

Wang, Yang, Xiangliang Jin, Yan Peng, Jun Luo, Zeyu Zhong, y Jun Yang. Analysis of High-Failure Mechanism Based on Gate-Controlled Device for Electro-Static Discharge Protection. IEEE, 2020.

Cita MLA (8a ed.)

Wang, Yang, et al. Analysis of High-Failure Mechanism Based on Gate-Controlled Device for Electro-Static Discharge Protection. IEEE, 2020.