A Novel Feature Extraction Method for Soft Faults in Nonlinear Analog Circuits Based on LMD-GFD and KPCA

To obtain feature information of soft faults in non-linear analog circuits in a more effective way, this paper proposed a novel feature extraction method for soft faults in non-linear analog circuits based on Local Mean Decomposition-Generalized Fractal Dimension (LMD-GFD) and Kernel Principal Compo...

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Autores principales: Xinmiao Lu*, Jiaxu Wang, Qiong Wu, Yuhan Wei, Yanwen Su
Formato: article
Lenguaje:EN
Publicado: Faculty of Mechanical Engineering in Slavonski Brod, Faculty of Electrical Engineering in Osijek, Faculty of Civil Engineering in Osijek 2021
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Acceso en línea:https://doaj.org/article/c6061fe296b94018ac1ff1306c4a71ea
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Sumario:To obtain feature information of soft faults in non-linear analog circuits in a more effective way, this paper proposed a novel feature extraction method for soft faults in non-linear analog circuits based on Local Mean Decomposition-Generalized Fractal Dimension (LMD-GFD) and Kernel Principal Component Analysis (KPCA). First, the fault signals were subject to LMD, the features of each component signal were extracted by GFD for the first time, and a high-dimensional feature space was formed. Then, KPCA was employed to reduce the dimensionality of the high-dimensional feature space, and feature extraction was performed again; at last, KPCA and Support Vector Machine (SVM) were adopted to diagnose the faults. The experimental results showed that the proposed LMD-GFD-KPCA method had effectively extracted the features of the soft faults in the non-linear analog circuits, and it achieved a high diagnosis rate.