Automatic Electroencephalogram Artifact Removal Using Deep Convolutional Neural Networks

Scalp electroencephalogram (EEG) is a non-invasive measure of brain activity. It is widely used in several applications including cognitive tasks, sleep stage detection, and seizure prediction. When recorded over several hours, this signal is usually corrupted by noisy disturbances such as experimen...

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Autores principales: Fabio Lopes, Adriana Leal, Julio Medeiros, Mauro F. Pinto, Antonio Dourado, Matthias Dumpelmann, Cesar Teixeira
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Publicado: IEEE 2021
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spelling oai:doaj.org-article:c66a76a4430f41249d8757fdbf5d62da2021-11-18T00:01:25ZAutomatic Electroencephalogram Artifact Removal Using Deep Convolutional Neural Networks2169-353610.1109/ACCESS.2021.3125728https://doaj.org/article/c66a76a4430f41249d8757fdbf5d62da2021-01-01T00:00:00Zhttps://ieeexplore.ieee.org/document/9605576/https://doaj.org/toc/2169-3536Scalp electroencephalogram (EEG) is a non-invasive measure of brain activity. It is widely used in several applications including cognitive tasks, sleep stage detection, and seizure prediction. When recorded over several hours, this signal is usually corrupted by noisy disturbances such as experimental errors, environmental interferences, and physiological artifacts. These may generate confounding factors and, therefore, lead to false results. Models able to minimise EEG artifacts are then necessary for improving further analysis and application. In this work, we developed an EEG artifact removal model based on deep convolutional neural networks. The proposed approach was applied on long-term EEGs, acquired from epileptic patients, available in the EPILEPSIAE database. The main goal of our work is to develop a model able to automatically and quickly remove artifacts from EEGs. To develop it, we used EEG segments, manually preprocessed by experts and named target EEG segments. Our approach was evaluated comparing denoised segments with the target segments. Furthermore, we compared our approach with other artifact removal models. Results show that the developed model was able to attenuate the influence of artifacts, present in long-term EEG signals, in a similar way to that performed by experts. Additionally, results evidence that our approach performs better than other artifact removal models, combining a minor reconstruction error with a fast processing. Being a fully automatic and fast model that does not require reference artifact templates, turns it suitable, for example, for continuous preprocessing of long-term electroencephalogram for sleep staging or seizure prediction.Fabio LopesAdriana LealJulio MedeirosMauro F. PintoAntonio DouradoMatthias DumpelmannCesar TeixeiraIEEEarticleArtifact removalautomatic reconstructiondeep convolutional neural networkselectroencephalogrampreprocessingElectrical engineering. Electronics. Nuclear engineeringTK1-9971ENIEEE Access, Vol 9, Pp 149955-149970 (2021)
institution DOAJ
collection DOAJ
language EN
topic Artifact removal
automatic reconstruction
deep convolutional neural networks
electroencephalogram
preprocessing
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
spellingShingle Artifact removal
automatic reconstruction
deep convolutional neural networks
electroencephalogram
preprocessing
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
Fabio Lopes
Adriana Leal
Julio Medeiros
Mauro F. Pinto
Antonio Dourado
Matthias Dumpelmann
Cesar Teixeira
Automatic Electroencephalogram Artifact Removal Using Deep Convolutional Neural Networks
description Scalp electroencephalogram (EEG) is a non-invasive measure of brain activity. It is widely used in several applications including cognitive tasks, sleep stage detection, and seizure prediction. When recorded over several hours, this signal is usually corrupted by noisy disturbances such as experimental errors, environmental interferences, and physiological artifacts. These may generate confounding factors and, therefore, lead to false results. Models able to minimise EEG artifacts are then necessary for improving further analysis and application. In this work, we developed an EEG artifact removal model based on deep convolutional neural networks. The proposed approach was applied on long-term EEGs, acquired from epileptic patients, available in the EPILEPSIAE database. The main goal of our work is to develop a model able to automatically and quickly remove artifacts from EEGs. To develop it, we used EEG segments, manually preprocessed by experts and named target EEG segments. Our approach was evaluated comparing denoised segments with the target segments. Furthermore, we compared our approach with other artifact removal models. Results show that the developed model was able to attenuate the influence of artifacts, present in long-term EEG signals, in a similar way to that performed by experts. Additionally, results evidence that our approach performs better than other artifact removal models, combining a minor reconstruction error with a fast processing. Being a fully automatic and fast model that does not require reference artifact templates, turns it suitable, for example, for continuous preprocessing of long-term electroencephalogram for sleep staging or seizure prediction.
format article
author Fabio Lopes
Adriana Leal
Julio Medeiros
Mauro F. Pinto
Antonio Dourado
Matthias Dumpelmann
Cesar Teixeira
author_facet Fabio Lopes
Adriana Leal
Julio Medeiros
Mauro F. Pinto
Antonio Dourado
Matthias Dumpelmann
Cesar Teixeira
author_sort Fabio Lopes
title Automatic Electroencephalogram Artifact Removal Using Deep Convolutional Neural Networks
title_short Automatic Electroencephalogram Artifact Removal Using Deep Convolutional Neural Networks
title_full Automatic Electroencephalogram Artifact Removal Using Deep Convolutional Neural Networks
title_fullStr Automatic Electroencephalogram Artifact Removal Using Deep Convolutional Neural Networks
title_full_unstemmed Automatic Electroencephalogram Artifact Removal Using Deep Convolutional Neural Networks
title_sort automatic electroencephalogram artifact removal using deep convolutional neural networks
publisher IEEE
publishDate 2021
url https://doaj.org/article/c66a76a4430f41249d8757fdbf5d62da
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