Deep learning enables structured illumination microscopy with low light levels and enhanced speed

Super-resolution microscopy typically requires high laser powers which can induce photobleaching and degrade image quality. Here the authors augment structured illumination microscopy (SIM) with deep learning to reduce the number of raw images required and boost its performance under low light condi...

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Autores principales:	Luhong Jin, Bei Liu, Fenqiang Zhao, Stephen Hahn, Bowei Dong, Ruiyan Song, Timothy C. Elston, Yingke Xu, Klaus M. Hahn
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2020
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/cb59b1d9328d413d81e5520a618431fc
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spelling	oai:doaj.org-article:cb59b1d9328d413d81e5520a618431fc2021-12-02T16:49:16ZDeep learning enables structured illumination microscopy with low light levels and enhanced speed10.1038/s41467-020-15784-x2041-1723https://doaj.org/article/cb59b1d9328d413d81e5520a618431fc2020-04-01T00:00:00Zhttps://doi.org/10.1038/s41467-020-15784-xhttps://doaj.org/toc/2041-1723Super-resolution microscopy typically requires high laser powers which can induce photobleaching and degrade image quality. Here the authors augment structured illumination microscopy (SIM) with deep learning to reduce the number of raw images required and boost its performance under low light conditions.Luhong JinBei LiuFenqiang ZhaoStephen HahnBowei DongRuiyan SongTimothy C. ElstonYingke XuKlaus M. HahnNature PortfolioarticleScienceQENNature Communications, Vol 11, Iss 1, Pp 1-7 (2020)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Luhong Jin Bei Liu Fenqiang Zhao Stephen Hahn Bowei Dong Ruiyan Song Timothy C. Elston Yingke Xu Klaus M. Hahn Deep learning enables structured illumination microscopy with low light levels and enhanced speed
description	Super-resolution microscopy typically requires high laser powers which can induce photobleaching and degrade image quality. Here the authors augment structured illumination microscopy (SIM) with deep learning to reduce the number of raw images required and boost its performance under low light conditions.
format	article
author	Luhong Jin Bei Liu Fenqiang Zhao Stephen Hahn Bowei Dong Ruiyan Song Timothy C. Elston Yingke Xu Klaus M. Hahn
author_facet	Luhong Jin Bei Liu Fenqiang Zhao Stephen Hahn Bowei Dong Ruiyan Song Timothy C. Elston Yingke Xu Klaus M. Hahn
author_sort	Luhong Jin
title	Deep learning enables structured illumination microscopy with low light levels and enhanced speed
title_short	Deep learning enables structured illumination microscopy with low light levels and enhanced speed
title_full	Deep learning enables structured illumination microscopy with low light levels and enhanced speed
title_fullStr	Deep learning enables structured illumination microscopy with low light levels and enhanced speed
title_full_unstemmed	Deep learning enables structured illumination microscopy with low light levels and enhanced speed
title_sort	deep learning enables structured illumination microscopy with low light levels and enhanced speed
publisher	Nature Portfolio
publishDate	2020
url	https://doaj.org/article/cb59b1d9328d413d81e5520a618431fc
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Deep learning enables structured illumination microscopy with low light levels and enhanced speed

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