X-ray radiation excited ultralong (>20,000 seconds) intrinsic phosphorescence in aluminum nitride single-crystal scintillators

Phosphorescence emission from extrinsic rare-earth element and organic component remains a challenge. Here, the authors demonstrate an ultraviolet ultralong intrinsic phosphorescence (UIP, >20,000 seconds) in aluminum nitride (AlN) single-crystal scintillator through X-ray excitation.

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Detalles Bibliográficos
Autores principales: Richeng Lin, Wei Zheng, Liang Chen, Yanming Zhu, MengXuan Xu, Xiaoping Ouyang, Feng Huang
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2020
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Acceso en línea:https://doaj.org/article/cc3a83d601c64695802e7a57d0f6d9e1
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Sumario:Phosphorescence emission from extrinsic rare-earth element and organic component remains a challenge. Here, the authors demonstrate an ultraviolet ultralong intrinsic phosphorescence (UIP, >20,000 seconds) in aluminum nitride (AlN) single-crystal scintillator through X-ray excitation.