A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes

Fault diagnosis in multistage manufacturing processes (MMPs) is a challenging task where most of the research presented in the literature considers a predefined inspection scheme to identify the sources of variation and make the process diagnosable. In this paper, a sequential inspection procedure t...

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Autores principales: Rubén Moliner-Heredia, Gracia M. Bruscas-Bellido, José V. Abellán-Nebot, Ignacio Peñarrocha-Alós
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Lenguaje:EN
Publicado: MDPI AG 2021
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Acceso en línea:https://doaj.org/article/cd51ffd510a04bdcad14a7c51caa998e
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spelling oai:doaj.org-article:cd51ffd510a04bdcad14a7c51caa998e2021-11-25T18:57:16ZA Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes10.3390/s212275241424-8220https://doaj.org/article/cd51ffd510a04bdcad14a7c51caa998e2021-11-01T00:00:00Zhttps://www.mdpi.com/1424-8220/21/22/7524https://doaj.org/toc/1424-8220Fault diagnosis in multistage manufacturing processes (MMPs) is a challenging task where most of the research presented in the literature considers a predefined inspection scheme to identify the sources of variation and make the process diagnosable. In this paper, a sequential inspection procedure to detect the process fault based on a sequential testing algorithm and a minimum monitoring system is proposed. After the monitoring system detects that the process is out of statistical control, the features to be inspected (end of line or in process measurements) are defined sequentially according to the expected information gain of each potential inspection measurement. A case study is analyzed to prove the benefits of this approach with respect to a predefined inspection scheme and a randomized sequential inspection considering both the use and non-use of fault probabilities from historical maintenance data.Rubén Moliner-HerediaGracia M. Bruscas-BellidoJosé V. Abellán-NebotIgnacio Peñarrocha-AlósMDPI AGarticlesequential inspectionfault detectionmultistage processinformation gainBayesian inferenceChemical technologyTP1-1185ENSensors, Vol 21, Iss 7524, p 7524 (2021)
institution DOAJ
collection DOAJ
language EN
topic sequential inspection
fault detection
multistage process
information gain
Bayesian inference
Chemical technology
TP1-1185
spellingShingle sequential inspection
fault detection
multistage process
information gain
Bayesian inference
Chemical technology
TP1-1185
Rubén Moliner-Heredia
Gracia M. Bruscas-Bellido
José V. Abellán-Nebot
Ignacio Peñarrocha-Alós
A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes
description Fault diagnosis in multistage manufacturing processes (MMPs) is a challenging task where most of the research presented in the literature considers a predefined inspection scheme to identify the sources of variation and make the process diagnosable. In this paper, a sequential inspection procedure to detect the process fault based on a sequential testing algorithm and a minimum monitoring system is proposed. After the monitoring system detects that the process is out of statistical control, the features to be inspected (end of line or in process measurements) are defined sequentially according to the expected information gain of each potential inspection measurement. A case study is analyzed to prove the benefits of this approach with respect to a predefined inspection scheme and a randomized sequential inspection considering both the use and non-use of fault probabilities from historical maintenance data.
format article
author Rubén Moliner-Heredia
Gracia M. Bruscas-Bellido
José V. Abellán-Nebot
Ignacio Peñarrocha-Alós
author_facet Rubén Moliner-Heredia
Gracia M. Bruscas-Bellido
José V. Abellán-Nebot
Ignacio Peñarrocha-Alós
author_sort Rubén Moliner-Heredia
title A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes
title_short A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes
title_full A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes
title_fullStr A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes
title_full_unstemmed A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes
title_sort sequential inspection procedure for fault detection in multistage manufacturing processes
publisher MDPI AG
publishDate 2021
url https://doaj.org/article/cd51ffd510a04bdcad14a7c51caa998e
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