A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes
Fault diagnosis in multistage manufacturing processes (MMPs) is a challenging task where most of the research presented in the literature considers a predefined inspection scheme to identify the sources of variation and make the process diagnosable. In this paper, a sequential inspection procedure t...
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MDPI AG
2021
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oai:doaj.org-article:cd51ffd510a04bdcad14a7c51caa998e2021-11-25T18:57:16ZA Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes10.3390/s212275241424-8220https://doaj.org/article/cd51ffd510a04bdcad14a7c51caa998e2021-11-01T00:00:00Zhttps://www.mdpi.com/1424-8220/21/22/7524https://doaj.org/toc/1424-8220Fault diagnosis in multistage manufacturing processes (MMPs) is a challenging task where most of the research presented in the literature considers a predefined inspection scheme to identify the sources of variation and make the process diagnosable. In this paper, a sequential inspection procedure to detect the process fault based on a sequential testing algorithm and a minimum monitoring system is proposed. After the monitoring system detects that the process is out of statistical control, the features to be inspected (end of line or in process measurements) are defined sequentially according to the expected information gain of each potential inspection measurement. A case study is analyzed to prove the benefits of this approach with respect to a predefined inspection scheme and a randomized sequential inspection considering both the use and non-use of fault probabilities from historical maintenance data.Rubén Moliner-HerediaGracia M. Bruscas-BellidoJosé V. Abellán-NebotIgnacio Peñarrocha-AlósMDPI AGarticlesequential inspectionfault detectionmultistage processinformation gainBayesian inferenceChemical technologyTP1-1185ENSensors, Vol 21, Iss 7524, p 7524 (2021) |
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sequential inspection fault detection multistage process information gain Bayesian inference Chemical technology TP1-1185 |
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sequential inspection fault detection multistage process information gain Bayesian inference Chemical technology TP1-1185 Rubén Moliner-Heredia Gracia M. Bruscas-Bellido José V. Abellán-Nebot Ignacio Peñarrocha-Alós A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes |
description |
Fault diagnosis in multistage manufacturing processes (MMPs) is a challenging task where most of the research presented in the literature considers a predefined inspection scheme to identify the sources of variation and make the process diagnosable. In this paper, a sequential inspection procedure to detect the process fault based on a sequential testing algorithm and a minimum monitoring system is proposed. After the monitoring system detects that the process is out of statistical control, the features to be inspected (end of line or in process measurements) are defined sequentially according to the expected information gain of each potential inspection measurement. A case study is analyzed to prove the benefits of this approach with respect to a predefined inspection scheme and a randomized sequential inspection considering both the use and non-use of fault probabilities from historical maintenance data. |
format |
article |
author |
Rubén Moliner-Heredia Gracia M. Bruscas-Bellido José V. Abellán-Nebot Ignacio Peñarrocha-Alós |
author_facet |
Rubén Moliner-Heredia Gracia M. Bruscas-Bellido José V. Abellán-Nebot Ignacio Peñarrocha-Alós |
author_sort |
Rubén Moliner-Heredia |
title |
A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes |
title_short |
A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes |
title_full |
A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes |
title_fullStr |
A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes |
title_full_unstemmed |
A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes |
title_sort |
sequential inspection procedure for fault detection in multistage manufacturing processes |
publisher |
MDPI AG |
publishDate |
2021 |
url |
https://doaj.org/article/cd51ffd510a04bdcad14a7c51caa998e |
work_keys_str_mv |
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