Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline via...

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Autores principales:	Mario Lanza, Quentin Smets, Cedric Huyghebaert, Lain-Jong Li
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2020
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/cf9888c2f89c4402b00519376d07fb64
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id	oai:doaj.org-article:cf9888c2f89c4402b00519376d07fb64
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spelling	oai:doaj.org-article:cf9888c2f89c4402b00519376d07fb642021-12-02T14:40:51ZYield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices10.1038/s41467-020-19053-92041-1723https://doaj.org/article/cf9888c2f89c4402b00519376d07fb642020-11-01T00:00:00Zhttps://doi.org/10.1038/s41467-020-19053-9https://doaj.org/toc/2041-1723The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.Mario LanzaQuentin SmetsCedric HuyghebaertLain-Jong LiNature PortfolioarticleScienceQENNature Communications, Vol 11, Iss 1, Pp 1-5 (2020)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Mario Lanza Quentin Smets Cedric Huyghebaert Lain-Jong Li Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
description	The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.
format	article
author	Mario Lanza Quentin Smets Cedric Huyghebaert Lain-Jong Li
author_facet	Mario Lanza Quentin Smets Cedric Huyghebaert Lain-Jong Li
author_sort	Mario Lanza
title	Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
title_short	Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
title_full	Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
title_fullStr	Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
title_full_unstemmed	Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
title_sort	yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
publisher	Nature Portfolio
publishDate	2020
url	https://doaj.org/article/cf9888c2f89c4402b00519376d07fb64
work_keys_str_mv	AT mariolanza yieldvariabilityreliabilityandstabilityoftwodimensionalmaterialsbasedsolidstateelectronicdevices AT quentinsmets yieldvariabilityreliabilityandstabilityoftwodimensionalmaterialsbasedsolidstateelectronicdevices AT cedrichuyghebaert yieldvariabilityreliabilityandstabilityoftwodimensionalmaterialsbasedsolidstateelectronicdevices AT lainjongli yieldvariabilityreliabilityandstabilityoftwodimensionalmaterialsbasedsolidstateelectronicdevices
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Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

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