Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in Cu $$_2$$ 2 Mo $$_6$$ 6 S $$_8$$ 8 by an advanced electrochemical strain microscopy method
Abstract Electrochemical strain microscopy (ESM) has been developed with the aim of measuring Vegard strains in mixed ionic-electronic conductors (MIECs), such as electrode materials for Li-ion batteries, caused by local changes in the chemical composition. In this technique, a voltage-biased AFM ti...
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| Autores principales: | , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/d0383806332c42c3a103e9bc1a04d49a |
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