Chip Appearance Defect Recognition Based on Convolutional Neural Network
To improve the recognition rate of chip appearance defects, an algorithm based on a convolution neural network is proposed to identify chip appearance defects of various shapes and features. Furthermore, to address the problems of long training time and low accuracy caused by redundant input samples...
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| Auteurs principaux: | , , |
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| Format: | article |
| Langue: | EN |
| Publié: |
MDPI AG
2021
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| Sujets: | |
| Accès en ligne: | https://doaj.org/article/d3ff6b6109ae4d20bd7ea26a80a5efae |
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