An improved image processing algorithm for automatic defect inspection in TFT-LCD TCON
The demand to improve image display in TFT-LCD, implementation of design for image processing is important. In order to meet the specific requirements of low-end Thin Film Transistor-Liquid-Crystal-Display (TFT-LCD) image display. This paper adopts a novel algorithm to conduct subsequent processing...
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| Autores principales: | , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
De Gruyter
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/d467cc7223444ae7acfc3179b179be07 |
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