Semiconductor SERS enhancement enabled by oxygen incorporation
The application of non-metal-oxide semiconductor materials as surface-enhanced Raman spectroscopy (SERS) substrates is impeded by their low SERS enhancement and detection sensitivity. Here, the authors develop a general oxygen incorporation strategy to magnify these parameters.
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| Main Authors: | , , , , , , , |
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| Format: | article |
| Language: | EN |
| Published: |
Nature Portfolio
2017
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| Subjects: | |
| Online Access: | https://doaj.org/article/d4c4d156718048e3a6056a66cbd7224d |
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| Summary: | The application of non-metal-oxide semiconductor materials as surface-enhanced Raman spectroscopy (SERS) substrates is impeded by their low SERS enhancement and detection sensitivity. Here, the authors develop a general oxygen incorporation strategy to magnify these parameters. |
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