In situ electrical and thermal monitoring of printed electronics by two-photon mapping
Abstract Printed electronics is emerging as a new, large scale and cost effective technology that will be disruptive in fields such as energy harvesting, consumer electronics and medical sensors. The performance of printed electronic devices relies principally on the carrier mobility and molecular p...
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Nature Portfolio
2017
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oai:doaj.org-article:d8fe0746ff6d4779a55b819efb4c94f92021-12-02T12:32:06ZIn situ electrical and thermal monitoring of printed electronics by two-photon mapping10.1038/s41598-017-03891-72045-2322https://doaj.org/article/d8fe0746ff6d4779a55b819efb4c94f92017-06-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-03891-7https://doaj.org/toc/2045-2322Abstract Printed electronics is emerging as a new, large scale and cost effective technology that will be disruptive in fields such as energy harvesting, consumer electronics and medical sensors. The performance of printed electronic devices relies principally on the carrier mobility and molecular packing of the polymer semiconductor material. Unfortunately, the analysis of such materials is generally performed with destructive techniques, which are hard to make compatible with in situ measurements, and pose a great obstacle for the mass production of printed electronics devices. A rapid, in situ, non-destructive and low-cost testing method is needed. In this study, we demonstrate that nonlinear optical microscopy is a promising technique to achieve this goal. Using ultrashort laser pulses we stimulate two-photon absorption in a roll coated polymer semiconductor and map the resulting two-photon induced photoluminescence and second harmonic response. We show that, in our experimental conditions, it is possible to relate the total amount of photoluminescence detected to important material properties such as the charge carrier density and the molecular packing of the printed polymer material, all with a spatial resolution of 400 nm. Importantly, this technique can be extended to the real time mapping of the polymer semiconductor film, even during the printing process, in which the high printing speed poses the need for equally high acquisition rates.Francesco PastorelliNicolò AccantoMikkel JørgensenNiek F. van HulstFrederik C. KrebsNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-6 (2017) |
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Medicine R Science Q Francesco Pastorelli Nicolò Accanto Mikkel Jørgensen Niek F. van Hulst Frederik C. Krebs In situ electrical and thermal monitoring of printed electronics by two-photon mapping |
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Abstract Printed electronics is emerging as a new, large scale and cost effective technology that will be disruptive in fields such as energy harvesting, consumer electronics and medical sensors. The performance of printed electronic devices relies principally on the carrier mobility and molecular packing of the polymer semiconductor material. Unfortunately, the analysis of such materials is generally performed with destructive techniques, which are hard to make compatible with in situ measurements, and pose a great obstacle for the mass production of printed electronics devices. A rapid, in situ, non-destructive and low-cost testing method is needed. In this study, we demonstrate that nonlinear optical microscopy is a promising technique to achieve this goal. Using ultrashort laser pulses we stimulate two-photon absorption in a roll coated polymer semiconductor and map the resulting two-photon induced photoluminescence and second harmonic response. We show that, in our experimental conditions, it is possible to relate the total amount of photoluminescence detected to important material properties such as the charge carrier density and the molecular packing of the printed polymer material, all with a spatial resolution of 400 nm. Importantly, this technique can be extended to the real time mapping of the polymer semiconductor film, even during the printing process, in which the high printing speed poses the need for equally high acquisition rates. |
format |
article |
author |
Francesco Pastorelli Nicolò Accanto Mikkel Jørgensen Niek F. van Hulst Frederik C. Krebs |
author_facet |
Francesco Pastorelli Nicolò Accanto Mikkel Jørgensen Niek F. van Hulst Frederik C. Krebs |
author_sort |
Francesco Pastorelli |
title |
In situ electrical and thermal monitoring of printed electronics by two-photon mapping |
title_short |
In situ electrical and thermal monitoring of printed electronics by two-photon mapping |
title_full |
In situ electrical and thermal monitoring of printed electronics by two-photon mapping |
title_fullStr |
In situ electrical and thermal monitoring of printed electronics by two-photon mapping |
title_full_unstemmed |
In situ electrical and thermal monitoring of printed electronics by two-photon mapping |
title_sort |
in situ electrical and thermal monitoring of printed electronics by two-photon mapping |
publisher |
Nature Portfolio |
publishDate |
2017 |
url |
https://doaj.org/article/d8fe0746ff6d4779a55b819efb4c94f9 |
work_keys_str_mv |
AT francescopastorelli insituelectricalandthermalmonitoringofprintedelectronicsbytwophotonmapping AT nicoloaccanto insituelectricalandthermalmonitoringofprintedelectronicsbytwophotonmapping AT mikkeljørgensen insituelectricalandthermalmonitoringofprintedelectronicsbytwophotonmapping AT niekfvanhulst insituelectricalandthermalmonitoringofprintedelectronicsbytwophotonmapping AT frederikckrebs insituelectricalandthermalmonitoringofprintedelectronicsbytwophotonmapping |
_version_ |
1718394185838493696 |