Dual-pulse photoactivated atomic force microscopy
Abstract Photoactivated atomic force microscopy (pAFM), which integrates light excitation and mechanical detection of the deflections of a cantilever tip, has become a widely used tool for probing nanoscale structures. Raising the illuminating laser power is an obvious way to boost the signal-to-noi...
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| Autores principales: | , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/dcca980e396c4c588c2db0a806031436 |
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