Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices

Advanced photonic probes are important for the development of non-contact wafer-scale testing of photonic chips. Here, Vynck et al. develop a quantitative technique based on mapping of transmittance variations by ultrafast perturbations to analyze arbitrary linear multi-port photonic devices.

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Autores principales:	Kevin Vynck, Nicholas J. Dinsdale, Bigeng Chen, Roman Bruck, Ali Z. Khokhar, Scott A. Reynolds, Lee Crudgington, David J. Thomson, Graham T. Reed, Philippe Lalanne, Otto L. Muskens
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2018
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/dd5f4fa5772c4eeda483237d7571d2ec
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spelling	oai:doaj.org-article:dd5f4fa5772c4eeda483237d7571d2ec2021-12-02T17:33:02ZUltrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices10.1038/s41467-018-04662-22041-1723https://doaj.org/article/dd5f4fa5772c4eeda483237d7571d2ec2018-06-01T00:00:00Zhttps://doi.org/10.1038/s41467-018-04662-2https://doaj.org/toc/2041-1723Advanced photonic probes are important for the development of non-contact wafer-scale testing of photonic chips. Here, Vynck et al. develop a quantitative technique based on mapping of transmittance variations by ultrafast perturbations to analyze arbitrary linear multi-port photonic devices.Kevin VynckNicholas J. DinsdaleBigeng ChenRoman BruckAli Z. KhokharScott A. ReynoldsLee CrudgingtonDavid J. ThomsonGraham T. ReedPhilippe LalanneOtto L. MuskensNature PortfolioarticleScienceQENNature Communications, Vol 9, Iss 1, Pp 1-10 (2018)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Kevin Vynck Nicholas J. Dinsdale Bigeng Chen Roman Bruck Ali Z. Khokhar Scott A. Reynolds Lee Crudgington David J. Thomson Graham T. Reed Philippe Lalanne Otto L. Muskens Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
description	Advanced photonic probes are important for the development of non-contact wafer-scale testing of photonic chips. Here, Vynck et al. develop a quantitative technique based on mapping of transmittance variations by ultrafast perturbations to analyze arbitrary linear multi-port photonic devices.
format	article
author	Kevin Vynck Nicholas J. Dinsdale Bigeng Chen Roman Bruck Ali Z. Khokhar Scott A. Reynolds Lee Crudgington David J. Thomson Graham T. Reed Philippe Lalanne Otto L. Muskens
author_facet	Kevin Vynck Nicholas J. Dinsdale Bigeng Chen Roman Bruck Ali Z. Khokhar Scott A. Reynolds Lee Crudgington David J. Thomson Graham T. Reed Philippe Lalanne Otto L. Muskens
author_sort	Kevin Vynck
title	Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
title_short	Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
title_full	Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
title_fullStr	Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
title_full_unstemmed	Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
title_sort	ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
publisher	Nature Portfolio
publishDate	2018
url	https://doaj.org/article/dd5f4fa5772c4eeda483237d7571d2ec
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Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices

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