Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices

Advanced photonic probes are important for the development of non-contact wafer-scale testing of photonic chips. Here, Vynck et al. develop a quantitative technique based on mapping of transmittance variations by ultrafast perturbations to analyze arbitrary linear multi-port photonic devices.

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Autores principales: Kevin Vynck, Nicholas J. Dinsdale, Bigeng Chen, Roman Bruck, Ali Z. Khokhar, Scott A. Reynolds, Lee Crudgington, David J. Thomson, Graham T. Reed, Philippe Lalanne, Otto L. Muskens
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2018
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Acceso en línea:https://doaj.org/article/dd5f4fa5772c4eeda483237d7571d2ec
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